250B Revision 30.03 06/23 1. Corrected an issue with the calibration clock display in the About... dialog on some 250B-2 cards. 2. Corrected a bug that would delete the fixture 5910 56 Ohm PI on etching systems. 3. Addressed another issue with continuous mode when left for several minutes. 250B Revision 30.02 05/23 1. If the raw output file gets larger than 16 MB, the file gets broken into multiple files and the name is serialized using the format -nn. 2. Code added to correct a problem with continuous measure mode in revision 30.00 did not work when the mode was left running for many minutes. Corrected that problem. 3. Corrected a problem with the VerifyCalibration command in the SimplifiedOLEInterface if the parameters did not follow a specific format. 4. Fixed bugs associated with saving the Enhanced Calibration file. 5. When edit is locked or password set to 0 in the INI file, since revision 19.60, when loading a new QCC file, the locked fields would not be updated to the new settings. Corrected that problem. 250B Revision 30.01 04/23 1. Brought in revisions 21.93 and 21.94 from the old-driver 250B. 1A. Added support for a new parameter to the SimplifiedOLEInterface command VerifyCalibration called fSecondsToDisplayResult so that the display can close automatically. 1B. Corrected a problem trying to set the frequency limit for cycle 3 when using an etcher. 250B Revision 30.00 04/23 gpc 1. Utilizes a new driver for S&A cards including the 250B. 2. Enhanced Calibration can now be saved and used by more than one QCC file. As long as the power settings for the QCC file match the enhanced calibration, it is allowed. 3. Fixed some display issues concerning window sizes. 4. Corrected an issue where continuous measure mode could sometimes become unresponsive to the keyboard and mouse. 5. Corrected a problem with the OLE call GetNamePlateDataX. Resistance, physical load, and reference CL values were incorrect. 6. Name changed from 250B.exe or 250Bw64.exe to 250BwND.exe. 7. Many changes to improve protection from crashes. 250B Revision 21.95 05/23 1. Corrected a problem with the VerifyCalibration command in the SimplifiedOLEInterface if the parameters did not follow a specific format. 250B Revision 21.94 05/23 1. Added support for a new parameter to the SimplifiedOLEInterface command VerifyCalibration called fSecondsToDisplayResult so that the display can close automatically. 2. Corrected a problem trying to set the frequency limit for cycle 3 when using an etcher. 250B Revision 21.93 04/23 1. No user significant changes. 250B Revision 21.92 03/23 1. Change made in last revision could cause the application to close. Corrected the problem. 250B Revision 21.91 03/23 1. Corrected an issue with frequency offsets on multiple 250B systems. 250B Revision 21.90 02/23 1. Calculated FL will now use frequency offsets if enabled like Measured FL and Physical FL. 250B Revision 21.87 01/23 1. No user significant changes. 250B Revision 21.86 12/22 1. On the etcher, when measuring one position and Etch to FL is selected, an error "SetMultiplePortSwitches called without any 250B referenced" could occur in some cases. Corrected that. 250B Revision 21.85 12/22 1. Corrected an issue with the mode selections (Calculated, Measured, etc.) when editing is turned back on. This has been a problem since revision 20.80. 250B Revision 21.84 12/22 1. Added 5910 50.0 Ohm Reflection Fixture for the wafer etcher. 250B Revision 21.83 12/22 1. Added support for wafer etcher. 250B Revision 21.82 11/22 1. No user significant changes. 250B Revision 21.81 11/22 1. Modified 750.0 Ohm PI fixture to improve calibration around 900 KHz. 250B Revision 21.80 10/22 1. Improved the output power applied when power applied is specified as "into RR". This was more significant on crystals with resistance much different than the fixture resistance. This change can increase the measurement time. 250B Revision 21.70 10/22 1. Size of serial number field on main view was increased. 2. A new function to search for a crystal serial number was added. If the serial number is found in the data, that measurement is moved to the top of the grid as if it were scrolled. This was added to the miscellaneous menu, the edit/delete crystal dialog accessed by clicking on the serial number field, and to OLE. 3. Corrected a bug since Revision 21.58 that caused fixtures that do not use the standard C0 frequency to generate an error when measuring C0. 250B Revision 21.60 09/22 1. Added raw spur phase to the simplified OLE interface command for GetSpurResults. 250B Revision 21.58 09/22 1. Corrected a bug when using "Update QCC File". An error "Field cannot be updated" was generated in this case. 250B Revision 21.57 08/22 1. No user significant changes. 250B Revision 21.56 08/22 1. No user significant changes. 250B Revision 21.55 07/22 Release B: Corrects an issue with the 250B-2 working in some PCIe slots on some motherboards. 1. If using all 30 test types, selecting a graph to display will not crash the software now. 250B Revision 21.54 06/22 1. No user significant changes. 250B Revision 21.53 06/22 1. No user significant changes. 250B Revision 21.52 06/22 1. No user significant changes. 250B Revision 21.51 06/22 1. No user significant changes. 250B Revision 21.50 05/22 1. Corrected an issue for temperature systems (W-2200 and W-2220). Measure F/R Only was using 10 averages regardless of the actual setting in the QCC file. 250B Revision 21.42 04/22 1. No user significant changes. 250B Revision 21.41 04/22 1. In Revision 21.20, the DLD raw output file behavior was changed. It was intended to work the same way the standard raw output file works. An error caused the DLD data to represent only the last measured crystal. That error has been corrected in this revision. 250B Revision 21.40 03/22 1. Added support for the new 50.0 Ohm Reflection SMD test fixture for higher frequencies. 2. Improved the settings for the 50.0 Ohm Reflection Bench Top test fixture. 3. Added the ability to set a C0 offset per 250B through the SetC0OffsetInKHz command in the simplified OLE interface. 250B Revision 21.30 03/22 Release B: Upgrade necessary. Corrects a problem with phase calibration. 1. No user significant changes. 250B Revision 21.22 03/22 1. Added support for a new revision of the 250D-2. 250B Revision 21.21 02/22 NOTE: 250C-2 and 250D-2 users running revision 20.90 or newer should update. Release B: Corrects an issue on 250C cards above 500 MHz. 1. A bug in Revision 20.90, could cause a small FL error at frequencies above 276 MHz. This has been corrected. 250B Revision 21.20 11/21 1. Added support for new 900 MHz 250D-2. 2. Significant improvements to enhanced calibration providing better DLD measurements when this feature is used. 3. Added an output power calculator under Miscellaneous menu. This can be used to convert from Watts or Amps to dBm or from dBm to Watts or Amps. 4. Added a routine Verify DLD Power Levels under Miscellaneous menu to verify that the power levels set in the DLD sweeps can be achieved at the reference frequency using the test fixture. 5. When a custom test fixture is being used and a new revision of the software creates a new fixture variable, a list of any missing fixture variables is now available after the missing variable warning is displayed. This can be used to help update the fixture definition in the INI file. 6. The DLD raw output file will now be overwritten when raw output is selected. Similar to the way the raw output file works. 7. Corrected the maximum frequency and calibration points for the 250C and 250C-2 for the 2220 50.0 Ohm Reflection fixture in the INI file. 8. Corrected a bug since revision 19.60, concerning the spur sweep power when using a QCC file created in older revision of the 250B software. Prior to this correction, no units would be selected in the edit dialog. 9. Corrected the expected open for the 2200 PI Barrel fixture to -80. 10. Changed the spur sensitivity used for reflection fixtures to improve the measurement speed on this fixture type when measuring spurs. 250B Revision 21.10 11/21 1. Since revision 20.90, if a test fixture has the C0 frequency above the calibration range, it is possible that C0 will not measure correctly. Fixtures affected: 750 Ohm, 50 Ohm Reflection Cable, and 2220 50 Ohm Reflection 250B Revision 21.01 11/21 1. No user significant changes. 250B Revision 21.00 10/21 NOTE: Recommended upgrade if running a revision from 20.90 through 20.99. 1. Improved power output settings over frequency in some cases. 2. Added an INI variable to override the output level used to determine power adjustment for frequency during calibration. This is needed on fixtures that calibrate below 19 KHz. 3. Fixed a problem that would not update CL when it was changed and then ENTER was pressed. 4. Fixed a bug since revision 20.90, that could corrupt fixture entries in the INI file for the number of calibration points if the INI file did not already exist. 5. Correct a bug since revision 20.90 that could cause the software to shutdown when the test type configuration was changed. 250B Revision 20.99 10/21 1. No user significant changes. 250B Revision 20.98 09/21 1. Changed the calibration power level for 250C-2 cards in the third range if they were set higher than 5.0 dBm to 5.0 dBm. 250B Revision 20.97 09/21 1. Since revision 20.90, for fixtures that require a separate C0 calibration in addition to standard calibration, a bug prevented the calibration data from being loaded. When attempting to measure, an error message would be displayed indicating that a wider frequency calibration was required for C0. This includes most low frequency fixtures such as the 1000K Ohm. 250B Revision 20.96 08/21 1. No user significant changes. 250B Revision 20.95 07/21 1. No user significant changes. 250B Revision 20.94 07/21 1. First revision since 20.70 that can support XP again. 2. No longer providing a Save As dialog when opening a new sweep setting file in the network analyzer if the previous sweep settings file is read-only. Error introduced in 20.90. 250B Revision 20.93 07/21 1. No longer reporting an error when opening a new sweep setting file in the network analyzer if the previous sweep settings file is read-only. Error introduced in 20.90. 250B Revision 20.92 07/21 1. Corrections to 20.90 release. 250B Revision 20.91 07/21 1. No longer reporting an error when exiting the network analyzer if the sweep settings file is read-only. Error introduced in 20.90. 250B Revision 20.90 05/21 1. Significantly improved enhanced calibration at higher frequencies. 2. Detected and displayed an error when saving the network analyzer settings. Previously, if an error occurred, the operator was not alerted and the settings were not saved. 3. Improved network calibration on the 250C-2. 4. Modified the verify calibration routine to support the 250C-2. 5. Added frequency offset to the following test types: RAWF, HDRV, FFR, all DLD frequency test types, all Spur Sweep frequency test types, all Spur frequency test types. 6. Enhanced the Wide (Nonlinear Crystal) sweep when using "into RR". This allows parts with a large FDLD to be measured using "into RR". 250B Revision 20.82 05/21 1. No user significant changes. 250B Revision 20.81 04/21 1. No user significant changes. 250B Revision 20.80 03/21 1. Added Measured FL@PWR mode. The Measured FL frequency is determined at the impedance of the Reference CL value which is higher than the impedance at resonance. This higher impedance causes the power to the crystal to be lower than what is specified in the "Power Applied" setting. The Measured FL@PWR mode measures the FR at this lower power level and determines the difference from the FR that was measured at the "Power Applied" setting. The FL measurement is then corrected for this difference. This feature provides an improvement in measured FL correlation to a measurement using a physical capacitor on a resonator that has a significant change in frequency with drive level (FDLD). 2. Corrected an issue that could result in a dead crystal measurement on a multiple 250B system when not using all 250Bs at once. 3. Corrected an issue that could cause the Measure FR Only measurement on a temperature system to hang. 4. Eliminated a "below minimum phase count" error at startup on some motherboards. 250B Revision 20.75 03/21 RELEASE B: Brings in a new DLL to support a new motherboard. 1. Previously, when measuring using the 250B application when it is running as a server for the temperature system, TMXR would show DMM Error. This has been corrected. 250B Revision 20.74 03/21 1. No user significant changes. 250B Revision 20.73 03/21 1. Create an Etching Controller system type. 2. Since revision 20.01 some OEM keys would not have been recognized. Corrected that. 250B Revision 20.72 03/21 1. Modifications were made to prevent a rare lockup when running as part of the W-2200 or W-2220. 250B Revision 20.71 02/21 1. No user significant changes. 250B Revision 20.70 02/21 1. Added support for some newer motherboards. 250B Revision 20.65 02/21 1. No user significant changes. 250B Revision 20.64 11/20 1. Slight change to frequency calibration. Very minor improvement in some cases. 250B Revision 20.63 10/20 1. In previous revisions, when deleting a test type out of an older QCC file, it was possible to get an error message concerning the value entered in one of the fields being out of range. When deleting, this makes no sense, so this error message will not display now. 250B Revision 20.62 10/20 NOTE: It is recommended that revision 19.60 through 20.61 upgrade to 20.62, especially if using spur sweeps. 1. Since revision 19.60, if the spur sweep power setting was defined as anything other than dBm, the actual level output was 0.0 dBm. This revision corrects that error in output power level. 250B Revision 20.61 09/20 1. Beginning with revision 20.36, after creating a new QCC file using "File->New", using "File->Save As" would create an invalid filename error. Corrected that. 250B Revision 20.60 09/20 1. Added test types RTD@P and RTDT@P for the W-2220. These measure the RTD when called by the 2200. This may vary from the RTD value used for curve-fitting and other post-processing because, often, the RTD value used for that is only measured once at the beginning of the DUT board. Those values are RTD and RTDT. 250B Revision 20.51 08/20 Release B: Corrects an error loading NVRAM with 250B, 250C, and 250B-1 cards at startup. 1. Includes 250BDLL revision 5.10 to solve a problem with mapping memory for the 250B-2 or 250C-2 in some Windows 10 PCs. 250B Revision 20.50 08/20 1. Supported the "Skipped Fixture Ports" variable for etching systems. 250B Revision 20.48 08/20 1. The SimplifiedOLEInterface command ClearAllMeasurements and DisableGraphUpdate were not setting the csResult variable. 250B Revision 20.47 07/20 1. Fixed a problem on multiple 250B systems with the CL test type when using OLE. 250B Revision 20.46 07/20 1. Corrected an issue which would clear the board cal files after performing an enhanced cal. Recalibrating after turning off enhanced cal is always a good idea, so this has little impact, but is proper. 2. On a multiple 250B system if the INI variable "Ports On A" was set greater than 1, measured FL would return "Dead on FL". This has been corrected. 250B Revision 20.45 06/20 1. No user significant changes. 250B Revision 20.44 06/20 1. Corrected a bug since revision 19.64 that prevented a dual 250B multiport system from allowing the second 250B. 250B Revision 20.43 05/20 1. The size of the DLD edit box can now be changed so it is easier to read the entire sweep setting. 2. Since revision 19.82, when Clear All Measurements was selected, any settings changes that had been made but had not been saved to the QCC file were changed from "pending" to "complete". As a result, no warning would be given when the QCC file was closed and the settings would become permanent. With this revision, previous behavior is restored so that the operator is prompted to save the changes. 3. Fixed a bug that since revision 19.82, would clear any settings changed via OLE when ClearAllMeasurements was called. 250B Revision 20.42 05/20 1. Since revision 20.36, RTD and RTDT test types would no longer measure in the 250B if it was running as a client for the W-2200. Corrected that. 250B Revision 20.41 05/20 1. When running as an OLE server for other applications like the etcher, several items could be selected by the operator that should not have been. Corrected those. 2. OLE clients can now detect when a measurement is occurring when the operator started it. 250B Revision 20.40 04/20 1. Includes a new revision of the W250BOLE DLL. 2. When user mode is locked via OLE, no longer allows test type editing. 250B Revision 20.39 04/20 1. Corrected a problem when setting up DLD sweeps via the SimplifiedOLEInterface and defining fewer sweeps than are currently loaded. Previous revisions would not clear the extra sweeps. 250B Revision 20.38 04/20 1. Since revision 19.81, internal standard and external standard were both checked when external standard was selected and they were both unchecked when internal standard was selected. Corrected with this revision. 250B Revision 20.37 04/20 1. No user significant changes. 250B Revision 20.36 03/20 1. In revision 19.81, after creating a new QCC file, it became necessary to do a "Save As" prior to making changes to any settings. That is no longer necessary in this revision. 2. It was possible to leave a window, such as the Network Analyzer, in a position that was not visible when it was reopened (if the display resolution or number of displays changed). If a SET file became corrupted, this could also occur. The software would appear to be locked up at that point. This revision makes sure any window opening is visible on the desktop. 3. The ability to change the number of averages used in the spur sweep was added in revision 19.60. If those averages were set and then another QCC file was loaded from an older revision of the software, the averages would remain the same as the previous QCC file unless modified. This has been corrected. 250B Revision 20.35 03/20 1. Corrected a problem on temperature test systems with test types that are not measured at all temperatures. Previous revisions would have set the value to 0.0 when the test type was not measured. This could result in a limit failure at a temperature that was not supposed to be measured. 250B Revision 20.34 03/20 1. No user significant changes. 250B Revision 20.33 03/20 1. Made an improvement to the measurement algorithm for Ceramic Resonator. 250B Revision 20.32 02/20 1. In revision 20.10 and 20.11, an error could appear during network calibration in some cases that was not valid. Corrected that. 2. Corrected some OLE interface issues with the Simplified OLE Interface command. 250B Revision 20.31 02/20 1. In the simplified OLE interface command SetNamePlateData, added support for the "Description" variable. 2. In revision 20.10, an error could appear during network calibration in some cases that was not valid. Corrected that. 3. A new error that was first detected in revision 20.30, has a clearer message in this revision. 4. A bug that could cause the 250B to close during a temperature run when all 30 test types are defined has been corrected. 250B Revision 20.30 02/20 1. Added an INI variable under GENERAL "Use Single 2451 for Ports on A and Ports on B" so that when a 50 ohm reflection benchtop fixture is used, it is possible to have 4 ports attached to A and 4 ports attached to B through a single 2451. 2. Since 20.10, an error could occur during network calibration depending on the calibration frequency range. This was corrected. 3. Improved crystal measurement in some cases when using Crystal Blank, Ceramic Resonator, Wide Ceramic Resonator, or High Q/High Time Constant sweeps. 250B Revision 20.21 02/20 1. New 250B DLL improves phase measurement in some cases. 250B Revision 20.20 01/20 1. Added an INI variable "Allow Operator to Override Description" to allow the operator to override the Description even if "Allow Editing" is turned off. 250B Revision 20.10 01/20 gpc 1. Improved phase tracking. 2. Improved one error message than can occur during calibration so it is clearer what is wrong. 3. Detect calibration files from newer version of the 250B application. Added an error message and prevent it from loading. 4. Improved FL measurements on 250B-2 and 250C-2 when using more than 20 samples for high Q parts. 5. Made the software more tolerant of a damaged QCC file. Saw evidence that some damaged QCC files would change the order of the test types after clearing the measurement data. This revision will prevent that and repair the file. 250B Revision 20.01 12/19 1. The last revision prevented access to OLE in Windows 10. That has been corrected. 250B Revision 20.00 11/19 1. Corrected an issue which could cause an error on printouts. 2. Added an INI variable "Allow Operator to Override CL Reference" to allow the operator to override the Reference CL selections even if "Allow Editing" is turned off. 3. When "Allow Operator to Override Frequency Reference" is enabled, the operator can now also modify the nameplate reference frequency, not just what is in the test types. 4. When "Allow Editing is turned off, no longer allow the operator to clear all measurements. This is now controlled by "Allow Operator to Edit or Delete Crystal When Editing Not Allowed". 250B Revision 19.95 11/19 1. Corrected a problem when displaying graphs and measuring on the second, third, or fourth 250B without measuring on the first 250B that could cause the program to close. 250B Revision 19.94 11/19 1. When changing units in Edit Spur Sweep, the start and stop will automatically convert to match the units. This ability was accidentally lost in revision 19.60. 250B Revision 19.93 10/19 1. Increased the ports allowed on a 250B-2 card running through OLE. 2. In previous revisions, noise from an open socket could cause a measurement outside the range of calibration. Eliminated this. 250B Revision 19.92 10/19 1. If one of "Etch to FL", "Etch to FR", "Plate to FL", or "Plate to FR" buttons had focus and the SAVE tool was clicked, the 250B could crash. Stopped this. 250B Revision 19.91 10/19 1. No user significant change. 250B Revision 19.90 09/19 If running 19.82, 19.83, or 19.84, need to upgrade. 1. DLD sweep and spur sweep editing is now unlocked. It was accidentally disabled in revision 19.82. 2. Fixed a situation where the software would close after measuring if the part was dead. This was a bug since revision 19.82. 250B Revision 19.84 09/19 1. Changes made in revision 19.60 prevented multiple 250B-2 cards from being recognized in a benchtop system on a single PC. 250B Revision 19.83 09/19 1. No user significant changes. 250B Revision 19.82 08/19 1. In the last revision, "Manual Measurement" and "Sweep" was mistakenly disabled in the Network Analyzer. 2. Corrected a problem that could cause a hang up if DLD or spur data was being graphed in graph 2 or graph 3 and measurements were being done continuously. 250B Revision 19.81 08/19 1. Improved the graph customization interface. 2. When a protected file name is in use, changes are now disabled. 3. When changes are disabled, can still open dialog boxes to see the settings in all cases now. 250B Revision 19.80 08/19 1. Added "1500 Ohm IF Filter" fixture definition. 2. Added "Enable Filter Test Types" INI variable. 250B Revision 19.70 07/19 1. Corrected a problem that prevented spur sweep averages from being saved to the database if overwritten (feature added in Revision 19.60). 2. Corrected a problem on systems with multiple 250Bs (5910i or Dual 5910i, for instance) that would only save frequency calibration for the first 250B. 3. Added SWMAXP, SWMINP, SWDLTP, SWMAXdbM, SWMINdBm, and SWDLTdBm test types. These test types analyze the spur sweep but return absolute min and max values instead of finding local min or local max based on sensitivity. SWMAXdBm replaced SSMAXdBm. SWMAXP is the same as SSMAXP but was included for consistency. 4. Improved the detection of a test type change that causes a need to erase the measurements already taken. 5. In some cases, the 250B could hang up when closing if an error message was being displayed. Fixed this. 6. Eliminated a problem that could cause a database error when saving data. 250B Revision 19.67 07/19 1. Corrected an issue where the software would think that the QCC file had changed when it had not. This would generate a warning when exiting the software. 250B Revision 19.66 07/19 1. No user significant changes. 250B Revision 19.65 07/19 1. Eliminates a long delay when measuring while etching that started with Revision 18.94. 250B Revision 19.64 07/19 1. Corrected a problem when using the 250B Multiport 16-port system. 250B Revision 19.63 06/19 1. Made changes necessary to support the latest W-2200 release. 250B Revision 19.62 06/19 1. Added support for Windows 10 250BMultiport. 250B Revision 19.61 06/19 1. Last revision could miss a change in configuration in some cases. Corrected that. 250B Revision 19.60 05/19 1. Added a function under Miscellaneous "Update QCC File Format...". This function modify a QCC file that has been updated from Office 98 but still will not open in Access 2007 or newer. The result of the modification is that file will then open. 2. Improved determination of whether or not it is necessary to clear data when a change is made to the QCC file. 3. Spur sweep averages can now be modified for a specific QCC file. 4. In some cases, the INI file could get destroyed or corrupted if the 250B software terminated abruptly. Changes were made that should eliminate that possibility. 5. Added the SSMAXdBm test type. 6. Updated the descriptions on several test types to make them clearer. 7. Corrected the "Load Resistance" setting in the "2200 750 Ohm LC SMD" fixture definition. 8. Added the "50.0 Ohm Reflection Bench Top" fixture definition. 250B Revision 19.52 05/19 1. No user significant change. 250B Revision 19.51 04/19 1. Added support for 5910 with custom high temperature option. 250B Revision 19.50 03/19 1. In revision 19.40, enhanced calibration was improved. In this revision, enhanced plus calibration is improved. 2. Made a change to verify calibration for 250C-2. 250B Revision 19.41 03/19 1. Now leaving network analyzer sweep and manual measurement in enhanced cal mode. 2. Added an indication at the top of the network analyzer setting panel showing the calibration mode. 250B Revision 19.40 03/19 1. Significantly improved enhanced calibration. DLD measurements are improved using this feature. 250B Revision 19.30 02/19 This Revision is HIGHLY recommended for all 250B-2 and 250C-2 cards. 1. The INI variable "Track Internal Reference" is now "250B-1 Track Internal Reference", "250C Track Internal Reference", "250B-2 Track Internal Reference", and "250C-2 Track Internal Reference". 2. Improved measurements when tracking internal reference. Highly recommended for all 250B-2 and 250C-2 cards. 250B Revision 19.20 02/19 1. No user significant changes. 250B Revision 19.11 01/19 1. No user significant changes. 250B Revision 19.10 11/18 1. Adds FDLD3 and FDLD4 test types. 2. Improved Measured FL in some cases when using Wide (Nonlinear Crystal) sweep with the power applied to the crystal set below 40 uW. 250B Revision 19.00 11/18 1. Calibration sets now include power calibration data. 250B Revision 18.94 10/18 1. Improved output dBm setting in some cases for 250B revisions since 18.10. 2. Improved noise immunity in some cases for 250B-2 and 250C-2 cards. 250B Revision 18.93 10/18 1. Modified the test type TC to provide a more accurate answer when a reflection fixture is used. 250B Revision 18.92 10/18 1. Last revision could stop working during a measurement with the 250B or 250B-1. 250B Revision 18.91 10/18 1. Corrected the information shown for the PCB revision in the About box for early 250B-2 and 250C-2 cards. 2. Attempted to improve phase measurements on 250B and 250B-1 style cards in some unusual cases. 250B Revision 18.90 10/18 1. When Output Raw Measurements is enabled, a comma-separated values file is now created that has the same name as the QCC file plus "-DLD Data". It contains the DLD sweep data. 2. The fixture "5250 5mW 50 Ohm PI" was misnamed in the fixtures list and would cause an error when selected. 250B Revision 18.82 09/18 1. Standard deviation numbers for manual measurements were not correct except on 250B-2 and 250C-2 cards. This version corrects that. 2. Previous versions could bomb if the Help->About menu was selected immediately after starting the 250B application. 250B Revision 18.81 09/18 1. Corrected an issue in the last revision that affected port selection during calibration. 250B Revision 18.80 09/18 1. Added IR system support for Windows 10. 250B Revision 18.72 08/18 1. Supports export to paths that contain multi-byte characters. 250B Revision 18.71 08/18 1. Added an error message when running as a server when there is an error attempting to save the current file before opening a new one. 2. Corrected an issue that could cause a long measurement during DLD when the crystal ended up measuring dead. 250B Revision 18.70 07/18 1. In revision 18.12, a bug was introduced that could inadvertently result in faster measurements at the expense of filtering resulting in noisier measurements. It is recommended that all revisions between 18.12 and 18.66 be upgraded. 2. Improved the repeatability of Measured FL measurements in some cases when using a frequency offset. 3. Warns when opening or closing a QCC file if the save file path stored in the QCC file does not exist. 4. Added the QCC save file path to the Setup Data dialog. 250B Revision 18.66 07/18 1. Allows the 250C-2 OLE access without a key. 2. Changed limits for max phase error at startup. 250B Revision 18.65 06/18 1. Corrected a bug from 18.64 that would generate an uninitialized software key error every other time the application was started via OLE. 250B Revision 18.64 06/18 1. Corrected a bug that could cause the software key to fail on a multiple 250B system running from OLE on anything other than Windows XP. 2. Corrected a bug that could cause a warning message concerning network calibration being needed due to a serial number change when it was not necessary. 250B Revision 18.63 06/18 1. Support PLD Revision 0.8 of the 250B-2 and 250C-2. 250B Revision 18.62 06/18 1. The change made in Revision 18.61 did not work. This revision now has the improvement. 250B Revision 18.61 06/18 1. Made measurements faster on multiple 250B systems with DLD when the first crystal is dead. 250B Revision 18.60 05/18 1. On dual etching systems, the option to have different ion gun power settings on each line was not functional between revision 15.401 and now. 2. Reworked the Verify Enhanced Calibration dialog to make it a shorter window. 3. Removed C0 from the verify enhanced calibration dialog. 250B Revision 18.50 05/18 1. Made a change that may improve targeting on the etching system. 2. Added roughing chamber 250B offsets to etching parameters. 250B Revision 18.41 05/18 1. Changed limits on phase calibration values. 2. Upgrade from revision 18.40 to avoid possible measurement errors. 250B Revision 18.40 03/18 1. Improvements to enhanced calibration for use with DLD. 2. Added the ability to verify enhanced calibration. 3. Improved handling of software keys to eliminate false errors. 4. Improved calibration for more accurate measurements. 5. Increased the allowed range of phase calibration values to support the 250B-2 on various motherboards. 250B Revision 18.35 03/18 1. Fixed a problem on 250B Multiport systems with dual 250B cards where port B was not accessible. 250B Revision 18.33 02/18 1. No user significant changes. 250B Revision 18.32 02/18 1. Revision 18.31 would show an error at startup on XP systems. Corrected that. 250B Revision 18.31 01/18 1. Supports having 250B data files in the Documents folder instead of ProgramData. Contact S&A to see how to enable this feature if this is preferred. 250B Revision 18.30 01/18 1. Supports the new 250C-2. 2. Corrects issues controlling the 250B software on Windows 10 from VB 6.0 or VB.NET. 250B Revision 18.20 01/18 1. Corrected an issue that could leave the output level on the 250B-2 lower than the operator programmed. All 250B-2 users should upgrade immediately. 2. Corrected a bug in the new SSMINX test type so that it now returns the correct value. 250B Revision 18.12 11/17 1. Corrected some issues with accessing the manual from the Help menu on Windows 10 systems. 2. Improved measurements on the 250B-2. 3. Added support for the W-5910i-2. 4. Corrected a problem where an OLE client could create an MFC error on a 250B-2. 250B Revision 18.11 11/17 1. Added an option in the Network Analyzer under View to show the 250B serial number on the graph. 2. Format of the SN file changed to include more information. 250B Revision 18.10 09/17 1. Improved C0 measurements in some cases on a W-2220 system. 2. Created a new manual measurement dialog that includes standard deviation of raw measurements among other improvements. 3. Added the SSMINX test type. 4. When saved graphs were opened in the Network Analyzer, the scale was not being restored. Corrected that. 5. Added the ability to run demo mode as a 250B-2. 6. FileDialog boxes were not set to allow resizing. At some point the default behavior changed on XP. Since the position and size of the file dialog box is saved and restored across application launches, this change could cause a file dialog box to be sized such that the buttons are not accessible. Since it could not be resized, it could not be used. FileDialog boxes are now set to allow resizing. 250B Revision 18.01 09/17 1. Support the W-2220 64 position TMX. 250B Revision 18.00 08/17 1. Support the 250B-2. 2. Added code to detect if a 250B serial number changed and the calibration files are not for that serial number. 3. If no 250B cards are found but the INI did not say Demo Mode, now give the operator the option to run in demo mode. 250B Revision 17.52 05/17 1. No user significant changes. 250B Revision 17.51 03/17 1. Fixed a bug with using OLE on Windows 10 with a licensed 250B card that generated a software key error. This bug was introduced in revision 17.41. 250B Revision 17.50 02/17 1. Improved the C0 measurement on tuning fork crystals on some 250B units. 250B Revision 17.42 02/17 1. No user significant changes. 250B Revision 17.41 02/17 1. This revision will allow 250Bs that are not licensed for Windows 10 to run in applications that are licensed for Windows 10. 250B Revision 17.40 01/17 1. Changed the description for most of the Spur Sweep test types to make it clearer what they measure. 2. Improved the Wide (Nonlinear Crystal) sweep type to work on higher frequencies. 250B Revision 17.39 10/16 1. If cards that are not authorized for Windows 10 are detected, their serial numbers are shown in the error message to help in purchasing a license. 250B Revision 17.38 10/16 1. No user significant changes. 250B Revision 17.37 09/16 1. No user significant changes. 250B Revision 17.36 06/16 1. No user significant changes. 250B Revision 17.35 05/16 1. Includes better handling of serial numbers on multiple 250B systems when measurements are cleared or QCC file is loaded. 2. QCC files are now all the same on each port if it is a multiple 250B system (for example, LANServer250B). 3. Now measures spurs at the same time on multiple 250B systems. 4. Added 250B access speed to About... box. 250B Revision 17.34 04/16 1. Make GetBinNumber in SimplifiedOLEInterface wait if a measurement is in progress. 250B Revision 17.33 03/16 1. Added support for the W-5600 on Windows 10. 250B Revision 17.32 03/16 1. Recent versions of the 250B software could generate a software key error 6241. This revision corrects that problem. 2. Corrected a problem since revision 17.23 where, when performing a DLD sweep with the initial power level specified as "into RR" and the fixture variable "Use Setup File Power Applied for Initial DLD Power" in the INI file was set to true, the application would shutdown. 250B Revision 17.31 02/16 1. Support Windows 10.0. 2. Fixed a problem with measure continuously on Windows 7 PCs. 250B Revision 17.30 01/16 1. Added more export options to the graph export feature now in the File menu. 2. Fixed a problem with the spur sweep analysis routine on a dead part. 250B Revision 17.23 01/16 1. Corrected an issue with power specified as "into RR" on 1000 KOhm fixtures when including a DLD swwep. 2. Improved the use of the sensitivity setting in the spur sweep test types so that using a large number of sweep points would work properly. 250B Revision 17.22 12/15 1. On XP systems, when upgrading using any revision since 17.10, the 250 INI file would get reset. This would reset any setting changes that had been made in that file and would change the DEMO MODE variable from false to true. This revision will no longer reset the INI file. 2. On XP systems, when upgrading using any revision since 17.10, the calibration files would not be readable. To correct this problem, a network calibration would have to be performed. Although S&A always recommends calibrating again after a software upgrade, this revision will read older calibration files without the need to recalibrate. 250B Revision 17.21 12/15 1. Added dHz and dKHz units to SSMINF test type. 250B Revision 17.20 12/15 1. Adds support for new S&A PCIe TTL I/O card. 2. Added SSC0 test type to measure C0 based on a spur sweep (local C0 for ceramic resonators/transducers). 3. Added a Wide Ceramic Resonator sweep. 4. Added an operator warning if a fixture selected (in the cal file that was loaded) is missing an INI variable setting. 5. Added more information to the calibration range warnings when a frequency was used that is out of the range of calibration. 6. Added INI variable "Use 2451 For Additional Ports" so that the need for the TTL I/O card could be turned off on systems with more than Port A and Port B being controlled by hardware other than the TTL I/O (and 2451). 7. Added INI category "Etch or Plate Target" with variable "FR Allowed" and "FL Allowed" so that one of the selections can be disabled. 8. Added INI category "Etching Method in List" with variables for all etching methods available so that some methods could be removed from the list. 250B Revision 17.14 11/15 1. Corrected a problem with the installation for Windows XP. 250B Revision 17.13 10/15 1. No user significant changes. 250B Revision 17.12 10/15 1. The last revision did not correct the problem with the OLE OEM client application. This revision solves that problem. 250B Revision 17.11 09/15 1. When starting an OLE OEM client application, a key error was generated at startup. This has been corrected. 2. In some cases, updating the database could create a corrupt file. Corrected that. 3. When the graph export was moved from the graph popup menu to the file menu in revision 17.10, the code was always exporting graph index 1 (middle graph). Corrected that. 4. Moved graph export on the network analyzer graph from the popup menu to the file menu in the network analyzer. 250B Revision 17.10 09/15 1. The graph export option would not work via the popup menu in Windows 7 due to an incompatiblity with newer Windows OS. Removed this feature from that menu and added it to the FILE menu. This export is in text format. The ability to export using metafile or bmp is lost. 2. Corrected problem that caused a problem when exporting via CrystalReports. 3. The PDF manual is now accessible from the Help menu. 250B Revision 17.05 08/15 1. Added 4 test fixture definitions for the 5250. 2. Improved database and OLE server data handling to reduce the chance of database corruption and program crash. 3. Added an INI variable "Allow Operator to Edit or Delete Crystal When Editing Not Allowed" so that operators cannot delete crystal data or edit crystal serial numbers when locked. 4. Made an attempt to further reduce the chance of corruption of the database. 5. Added 5510A and renamed 5510 to 5510B, this was changed to support older systems with 5XXX controllers. 250B Revision 17.04 07/15 1. Removed flicker from screen when updating the database. 2. Warn if templates do not exist when creating a new database. 3. Created a High Q Fast sweep type. It requires that the reference frequency is FR. 4. Created a Narrow Fast Search sweep type that can use a shorter delay than High Q requires. It requires that reference frequency is FL to make a good FL calculation. 5. The units shown for the Typical L in the new Narrow Fast Search sweep type was ppm instead of H in the last revision. 250B Revision 17.03 07/15 1. Revisions for Windows 7 versions of the 250B will now begin with 17. 2. Revision 15.02 had a bug that would corrupt the network calibration files. Any installations of 15.02 need to upgrade to 17.03. 250B Revision 15.62 09/17 1. Improved C0 measurement in some cases for W-2220 systems. 250B Revision 15.61 09/17 1. Improved the reliabilty of reading the DUT Board ID in the W-2220 systems. 250B Revision 15.60 09/17 1. Supports 64 position TMX measurement for the W-2220. 250B Revision 15.50 08/17 1. Added Save Calibration by DUT Board ID for the W-2220. 250B Revision 15.48 05/17 1. Eliminated one condition that would generate a power level error message when it shouldn't. In some cases, this could shut down the program. 2. Some changes to the etching parameters were not being detected, so the etcher was not aware they had occurred during a "PAUSE" condition. Corrected that. 250B Revision 15.47 04/17 1. Increased the number of parameter changes that the software would detect and report to client programs. This was done so that the etcher could determine that changes had been made by the operator during a "PAUSE" condition. 250B Revision 15.46 02/17 1. Improved the ability to measure some 400 MHz parts. 2. Changed the description for most of the Spur Sweep test types to make it clearer what they measured. 3. Improved first measurement repeatability by modifying the 250B output off condition. 4. Added a message at startup if the network calibration does not match the 250B that is installed. 250B Revision 15.45 10/16 1. No user significant changes. 250B Revision 15.44 09/16 1. Changed the REFFR test type so it includes the etching offset when an etching system and the plating offset when a plating system. 2. Restored the ability to detect older version parallel port software keys that was lost in revision 15.43. 250B Revision 15.43 05/16 1. Support newer revision USB software keys. 250B Revision 15.42 05/16 1. If the INI settings for a fixture were modified, but the fixture type was not changed when network calibration was performed, those updated settings were not being retrieved. As a result, the INI settings that were recorded during the last network calibration were used instead. Corrected this behavior so that a network calibration always reload fixture INI settings. 250B Revision 15.41 05/16 1. No user significant change. 250B Revision 15.401 04/16 1. Added separate power settings for the ion guns for line 1 and line 2 during etching. 2. Added an etcher parameter to allow the roughing chamber to create the UNLOAD.INI file. 250B Revision 15.31 03/16 1. Fixed a bug that would generate an erroneous error message about C0 calibration when the calibration range specified for a fixture did not include the C0 frequency. 250B Revision 15.30 02/16 1. Support "Number Of Types To Display" variable in etcher and plater "Pallet Types" and etcher "Recipe Types" category. This allows fewer types to be included in a drop list and allows better control over the order of the types shown. 2. Support "Number Of Fixtures To Display" variable in the 250B's "Network" category. This allows fewer types to be included in a drop list and allows better control over the order of the types shown. 3. Enabled JPEG export from graphs. 4. Changes to the routine that affects Pallet Types included listing the types in numerical order rather than in the order in the INI file. That way Type 20 follows Type 2 as would be expected. 250B Revision 15.22 01/15 1. Fixed a situation that would hang the software with a spur sweep on a dead crystal since revision 15.20. 250B Revision 15.21 01/16 1. No user significant changes. 250B Revision 15.20 11/15 1. Fixed a bug with the entry limit on the sensitivity input for spur sweeps. 2. Added dHz and dKHz units to SSMINF test type. 3. Adds support for new S&A PCIe TTL I/O card. 4. Added SSC0 test type to measure C0 based on a spur sweep (local C0 for ceramic resonators/transducers). 5. Added a Wide Ceramic Resonator sweep. 6. Added an operator warning if a fixture selected (in the cal file that was loaded) is missing an INI variable setting. 7. Added more information to the calibration range warnings when a frequency was used that is out of the range of calibration. 8. Added INI variable "Use 2451 For Additional Ports" so that the need for the TTL I/O card could be turned off on systems with more than Port A and Port B being controlled by hardware other than the TTL I/O (and 2451). 9. Added INI category "Etch or Plate Target" with variable "FR Allowed" and "FL Allowed" so that one of the selections can be disabled. 10. Added INI category "Etching Method in List" with variables for all etching methods available so that some methods could be removed from the list. 11. Corrected an issue with power specified as "into RR" on 1000 KOhm fixtures when including a DLD swwep. 12. Improved the use of the sensitivity setting in the spur sweep test types so that using a large number of sweep points would work properly. 250B Revision 15.15 10/15 1. No user significant changes. 250B Revision 15.14 09/15 1. Added fixture information to INI file for 5510A and 5510B systems. 2. Corrected a problem from revision 15.10 when using "Narrow Fast" to improve the C0 measurement. 250B Revision 15.13 09/15 1. Made an attempt to further reduce the chance of corruption of the database. 2. Added 5510A and renamed 5510 to 5510B, this was changed to support older systems with 5XXX controllers. 250B Revision 15.12 08/15 1. Added 4 test fixture definitions for the 5250. 2. Improved database and OLE server data handling to reduce the chance of database corruption and program crash. 3. Added an INI variable "Allow Operator to Edit or Delete Crystal When Editing Not Allowed" so that operators cannot delete crystal data or edit crystal serial numbers when locked. 250B Revision 15.11 07/15 1. The units shown for the Typical L in the new Narrow Fast Search sweep type was ppm instead of H in the last revision. 250B Revision 15.10 06/15 1. Created a High Q Fast sweep type. It requires that the reference frequency is FR. 2. Created a Narrow Fast Search sweep type that can use a shorter delay than High Q requires. It requires that reference frequency is FL to make a good FL calculation. 250B Revision 15.02 05/15 1. Made changes to improve handling of non-English languages. 2. The time being stored into the QCC file was being stored with daylight savings time turned off. As a result, in regions of the world where DST is used, the time stored in the file would be one hour later than actual when DST was in effect. 3. Corrected an issue that would cause the new sweep type QCC file to prompt when it was closed as if something had changed in the setup when it had not. 250B Revision 15.01 05/15 1. No user significant changes. 250B Revision 15.00 03/15 1. Initial support for Windows 7 64-bit. 250B Revision 14.99 05/15 1. The time being stored into the QCC file was being stored with daylight savings time turned off. As a result, in regions of the world where DST is used, the time stored in the file would be one hour later than actual when DST was in effect. This has been in the 250B software since revision 1.00 but is now corrected. 250B Revision 14.98 05/15 1. Corrected an issue that would cause the new sweep type QCC file to prompt when it was closed as if something had changed in the setup when it had not. 250B Revision 14.97 04/15 1. Added support for a feature in the etcher that improves final resistance measurements when using single pass etching. 2. Fixed a bug that would show unused ports in the select port menu on an etcher in some cases. 3. Removed a prompt for a file name at exit when running as an OLE server in some cases. 250B Revision 14.96 04/15 1. Corrected a problem since last revision that would cause the 250B to hang on shutdown in the etcher. 250B Revision 14.95 03/15 1. Modified the way the database is handled in a client mode application so the behavior is as expected when switching between the 250B application and the client application (like a sorter or pick and place system). 2. Improved the startup time of the 250B application in some cases when running as a client. 250B Revision 14.94 02/15 1. Revision 14.90 through 14.93 could stop communicating with the 250B cards. This revision corrects the problem. 250B Revision 14.93 02/15 1. No user significant changes. 250B Revision 14.92 01/15 1. No user significant changes. 250B Revision 14.91 01/15 1. Changed the etching parameters dialog so that when the box opens, the matrix selection is no longer highlighted. This prevents accidental changing of the selection by the operator. 250B Revision 14.90 01/15 1. Fully supports the PCIe DIO-96H. 2. Added an INI variable to allow calibration if "Allow Editing..." is set to NO. 250B Revision 14.82 12/14 1. No user significant changes. 250B Revision 14.81 11/14 1. Add 250B-1LQ support. 2. Corrected the values shown for the output power levels on a DLD graph when using a reflection fixture. 250B Revision 14.80 11/14 1. Support DIO-96e. 2. New DLL and RTD TMX Mgr. 250B Revision 14.70 10/14 1. Add recognition of OCXO version. 250B Revision 14.65 10/14 1. Removed erroneous software key error on Dual 250B IR systems. 250B Revision 14.64 05/14 1. COrrected measurements on reflection fixtures below the minimum Cstray frequency specified in the fixture definition. 2. Changed expected load amplitude from -72 to -64 on 2220 50.0 Ohm Reflection fixture (all systems were being changed prior to shipment). 250B Revision 14.63 04/14 1. Change made in 14.50 made "File/New" not work. This would also cause the ODBC administrator dialog to appear if current or server mdb files were missing. 250B Revision 14.62 04/14 1. Change made in 14.50 did not work in Windows 98. 250B Revision 14.61 04/14 1. Increased maximum resistance entry for applied power to 1 MOhm and made entry field larger. Also allowed scrolling of entry field so all digits can be entered and viewed. 250B Revision 14.60 03/14 1. Added a new test type C0-0 to allow the operator to enter an offset. 250B Revision 14.50 03/14 1. Added an etching parameter "Roughing Chamber Offset" for the measurement made in a roughing chamber to allow for tuning fork crystals which may be about 300 ppm offset due to not being measured at vacuum. 2. In the Adjust Port Offsets window, added a button to load the offsets from a comma separated file. 250B Revision 14.46 02/14 1. Protected software from error when attempting to print without a print driver installed. 2. Added 910A 1000K Ohm, and 941A Reflection test fixtures. 250B Revision 14.45 01/14 1. This version fixes a bug in 14.44 that would sometimes generate a software key error when started as an OLE server. 250B Revision 14.44 01/14 1. This version will show the correct number of ports on multiple 250B systems even when not started by OLE. 250B Revision 14.43 01/14 1. Added the ability to pass a "NoPrompt" parameter to the SimplifiedOLEInterface command VerifyCalibration so that the initial prompt to the operator to insert the load resistor could be skipped. 250B Revision 14.42 12/13 1. Added the INI [GENERAL] variable "Allow Operator to Override Frequency Reference". This will allow the operator to change the frequency reference setting in a test type, even if Allow Editing is turned off. 250B Revision 14.41 11/13 1. No user significant changes. 250B Revision 14.40 10/13 1. New feature allows graph scaling and color to be permanently saved to the QCC file for DLD,SPUR,and BIN graph types. To enable this feature, set the new INI variable "Allow Graph Customization" to yes. 2. Fixed a condition that could cause the software to hang for certain QCC files during update at startup. 3. Added the new test SSMAXP which returns the maximum phase found within the spur sweep. 4. Added MeasureRaw and MeasureRX to the SimplifiedOLEInterface. 250B Revision 14.34 09/13 1. Added key support for Dual 250B-1L. 2. Prevent warning message when measuring a dead part with a limited calibration range. 250B Revision 14.33 08/13 1. Fixed a problem with systems that use the 2451 to add extra ports accessing those extra ports (bug since revision 13.10). 2. Improved FL measurements on many 5910i systems for AT-cut crystals. Should improve final frequency spread. 250B Revision 14.32 08/13 1. Added support for W-910A sorter. 2. Added POSITION test type. 250B Revision 14.31 07/13 1. Fixed a problem where the sweep button in network analyzer was not selectable after resizing window since revision 13.93. 250B Revision 14.30 07/13 1. No user significant changes. 250B Revision 14.202 07/13 1. Improved the repeatability of the C0 measurement for crystals with frequency between 20.7 MHz and 21.51 MHz. 250B Revision 14.201 07/13 1. An INI variable will now allow the first port offset to be non-zero. 2. Made a change to improve the C0 and FL measurements on most 5910i PCBs. 250B Revision 14.10 06/13 1. Improved the repeatability and speed of the C0 measurement algorithm for some crystals. 250B Revision 14.01 06/13 1. DLD10 and DLDH3 test types are now both in percent. 250B Revision 14.00 06/13 1. Added support for Dual1X8 system. 2. Added DLD10 and DLDH3 test types. 250B Revision 13.93 06/13 1. Since revision 13.90 (XP look and feel) the 250B would not work on Windows 95 computers. Corrected the problem. 250B Revision 13.92 06/13 1. Final changes required for roughing chamber. 250B Revision 13.91 06/13 1. Changes required to support initial roughing chamber release. 250B Revision 13.90 06/13 1. Added 5910 1000K Ohm 7uw 32POS and 5910 High Drive 1000K Ohm 7uw 32POS fixture definitions. 2. Fixed a problem that could cause an error updating some QCC files to the current revision. 3. Created a new screen to select ports on some systems including etchers instead of using a long drop menu. 4. In some multiple 250B systems (etchers), made a change that could slightly improve C0 measurements in some cases. 5. All progress bars are now smooth blue bars instead of green blocks. 250B Revision 13.81 03/13 1. Changed Reference CL to display up to 3 decimal places on the view. 2. Changed the CL entry values in test types to display up to 3 decimal places. 3. Corrected the name in the fixture list for the "50.0 Ohm Reflection Cable". 4. Improved measurement time if "Use Setup File Power Applied for Initial DLD Power" is yes. 250B Revision 13.80 03/13 1. Adds an INI fixture variable "Use Setup File Power Applied for Initial DLD Power" to allow a fixture to use the QCC Power Applied setting for the initial DLD measurement. In this case, that initial measurement is used as the nominal measurement saving the time of measuring Fr twice. This is used when the power at nominal is expected to have no affect on DLD measurements such as for tuning fork crystals. 2. Added a warning if a frequency is being measured that is outside the calibration range. 3. Added High Drive After Cycle1 as an option in the etching parameters. 4. Added the ability to override the high drive power level at any place high drive is configured in the etching parameters. 5. For etching systems with multiple 250Bs, added the ability to have a frequency offset by 250B index in the etching parameters. 6. Added OLE command SetHighDrivedBm. 250B Revision 13.71 03/13 1. Allow selection of port B on temperature systems if port B is not being used by the chamber. 2. Added OLE command SweepRX. 250B Revision 13.70 02/13 1. Added support for 250B-1L. 2. Added FDLD1 (min) and FDLD2 (max). 3. Added a fixture for the 50 Ohm Reflection Cable. 250B Revision 13.62 02/13 1. Added HSOM test type for W-2220. 2. Added "dOhms" as units for R/T test type for W-2220. 3. Improved measurement speed via OLE on an IR system. 250B Revision 13.61 01/13 1. Added Verify Calibration command to the Simplified OLE Interface. 250B Revision 13.60 01/13 1. Changed 5910 High Drive test fixture expected amplitude open from -82.0 to -72.0 to work with the universal measurement PCB. 250B Revision 13.52 01/13 1. Corrected problem with Z and Phase values on spur sweep data via OLE. 250B Revision 13.51 01/13 1. Last revision was not measuring the RTD temperature or TMX resistance. Corrected this. 250B Revision 13.50 01/13 1. Improved C0 measurement repeatability for certain frequency crystals. 2. Added TMXR test type for the W-2220. 3. Using new RTD/TMX Manager server for RTD temperature (RTDT) or TMX resistance (TMXR) measurements. 4. Corrected plating parameters dialog for carousal platers. 5. Fixed the spur sweep test types so that they will no longer return "no spur" if the sweep starts within 10 ppm of resonance. 250B Revision 13.40 12/12 1. Shows Bus index along with Slot index for multiple 250Bs in About... box. 2. Add the ability to set a different delay and different number of averages for each DLD step. 3. Added an OLE routine called SimplifiedOLEInterface that uses three BSTR variables to interface with a client application to accomplish control and communication with the 250B. This was done to simplify the interface needed to support multiple 250Bs and to eliminate the use of VARIANT data types. 4. This revision along with DLL 3.22 improved the measurement time for multiple 250B systems. 250B Revision 13.31 12/12 1. Added code so that enhanced calibration dialog box would pop to the top when called via OLE and would allow the client application to come back to the top after each step. 250B Revision 13.30 12/12 1. Added OLE calls needed to perform enhanced calibration. 250B Revision 13.20 11/12 1. Improved the way the QCC path name is handled when copying files from another location and then opening them with the 250B. 2. Added a C0-1 test type. It is a C0 measurement done before all other measurements. If the measurement fails the limits specified, no other measurements are performed. 3. Added a Z test type. It returns either the impedance measured or the dB relative to a short at a specified frequeny using a specified number of averages. 4. Added support for a Quad 250B OLE software key. 250B Revision 13.15 10/12 1. Fixed a problem with 4 row W-2200 systems or dual chamber W-2200 systems and port selection when running the 250B. This became a problem in revision 13.10. 2. When using an RTD for temperature measurements (RTD test type), added the ability to set the minimum and maximum RTD or Thermistor values in the RTD INI file instead of being fixed at 5 KOhms. 3. Added Thermistor Coefficients option to the RTD INI file. Uses Steinhart-Hart polynomial equation. 250B Revision 13.14 09/12 1. Fixed a situation where the application might synchronize the 250Bs when it did not need to or fail to synchronize them when it needed to. 250B Revision 13.13 09/12 1. No user significant change. 250B Revision 13.12 09/12 1. The value for Output Check Frequency and Open Minimum Output Level Delta were set wrong for the 5910 5 mW High Drive 56 Ohm PI. This feature should have been disabled since the fixture requires the high drive amplifier. 2. Added OLE command FileSave so measurements generated from a client application can be saved. 3. Multiport systems, etching system, and plating systems were prevented access to the high drive ports since revision 13.10. 4. Added the ability to track the internal reference. 5. Added an OLE command to MeasureInternalReference so clients can force the tracking when convenient. 250B Revision 13.11 09/12 Do not use revision 13.10 1. Fixed a major problem in revision 13.10 that would reset sweep settings to Normal and 10 averages. 2. In some cases, it was not possible to select a some ports via the 250B application using revision 13.10. This has been corrected. 250B Revision 13.10 DO NOT USE THIS REVISION 09/12 1. Added new test types for W-2220: HSO, HSOT, RFSS, RFSST, RFHS, and RFHST. 2. For test types that can have a temperature range specified, added the ability to select temperatures by table line number instead of just minimum and/or maximum temperature. 3. Added support for 192 position multiport system. 4. If no test type is defined that includes the sweep definition, the sweep will now be set to Normal with 10 averages. 5. Added engineering exponent options for units to A0, A1, A2, A3, A4, A5, and A6 test types. 250B Revision 13.05 08/12 1. On etching systems, when no measurements had been made, the first time the measure button on the etcher was used, the scroll bars for the vertical scroll on the 250B would appear disabled. This has been corrected. 250B Revision 13.04 08/12 1. Fixed a bug that would cause the 250B to close when the measure button was pressed and RTD or RTDT was included as a test type. Bug since revision 13.01. 250B Revision 13.03 07/12 1. No user significant change. 250B Revision 13.02 07/12 1. Fixed a problem with the 10-point table lookup for RTDs. 2. Added an INI setting to be able to set the range on the DMM so it will not switch ranges. The 34401A will change from 1 mA to 0.1 mA above 1K range causing a discontinuity in temperature readings. 07/12 1. Improved handling of shared COM port (DMM for RTD). 250B Revision 13.00 06/12 1. Newer look and feel. 2. Corrected power measurements specified as Watts on reflection fixtures (W-2220). 250B Revision 12.90 06/12 1. Added Bin Quantity as option to main view. 250B Revision 12.80 04/12 1. Improved Narrow mode measurements on etcher. 2. Added OLE calls GetNamePlateDataX and GetPowerApplied. 3. Added fixture variable "Synchronize 250Bs" in the INI file. This is needed on certain etching measurement PCBs. 4. Added the ability to select the port from the manual measurement screen. 5. Show other 250B frequency and power settings on manual measurement if more than one 250B (etching systems). 6. Added an OLE call SynchToClientApplication to synchronize the raw output between the 250B and a client program (such as the etcher). 250B Revision 12.81 1. Added support for 5710-1 plater. 250B Revision 12.70 03/12 1. Now supports up to 6th order curvefit for W-2200 temperature test system. 2. Added curvefit test types CF0, CF1, CF2, CF3, CF4, CF5, and CF6 to allow the operator to specify a different temperature offset than 26 C. 3. Added test type RTD and RTDT. This will read the value of an RTD via a DMM. RTD is resistance and RTDT is temperature. For temperature, RTD.INI file entries specify S&A coefficients, ITS-90 coefficients, or a table of up to ten points with linear interpolation. 250B Revision 12.61 04/12 1. Corrected a bug since revision 12.34. Since then, a dead part with a test type that requires a DLD sweep would result in C0 being misreported. 2. Related to the bug corrected in item 1, in one reported case, this caused the 250B software to hang up. It seems possible it could also result in an exception error or application shutdown since the error could occur while formatting text for the screen. 250B Revision 12.60 03/12 1. Improved "Narrow" mode sweep for most cases using etch to FL. 2. Added a new sweep type "Narrow with Specified Delta F" to allow the delta frequency used in narrow mode to be specified in the setup file. 250B Revision 12.52 02/12 1. Improve measurements for some 32 KHz oscillators for the W-5910 system. 250B Revision 12.51 01/12 1. Added the ability to run the etcher without the neutralizer in the etching parameters screen. 250B Revision 12.50 12/11 1. Added frequency limit to etching cycle 2 and 3. 250B Revision 12.40 11/11 1. If using Wide (NonLinear Crystal) sweep and setup file power level is less than calibration power level, use setup file power level for FL measurement instead. 250B Revision 12.38 10/11 1. Added KOhms as a unit for RR test type. 250B Revision 12.37 10/11 1. Changed the default INI setting for Calibration Amplitude Error from 25.0 to 75.0. Allows calibration of more fixtures with the 250D. 2. Added access to etching parameters button when access is locked so that pallet type, target frequency, and etching timeout can still be adjusted. 3. Improved start up time for Dual 250B OLE key access. 250B Revision 12.36 09/11 1. W-2200 benchtop systems now support the 250B OLE software key. 2. Changed the following fixtures to check phase delta at 800K Hz instead of 500 KHz: 5910 1000K Ohm, 5910 1000K Ohm II, 5910 1000K Ohm 32POS, and the high drive fixtures associated with them. 250B Revision 12.35 08/11 1. Corrected a calculation to fix a problem where deleting crystals could sometimes cause a negative number of occurrences on the histogram graphs. 250B Revision 12.34 08/11 1. Network calibration in the last revision did not present the box asking for Cy values. Corrected this problem. 2. Dual OLE 250Bs can now sweep DLD on both 250Bs at the same time. 3. Added an SA250B.Document OLE entry to be consistent with key created for the 280A. 4. If all calibration files had been deleted (or were not present) and only one of the two ports (A or B) had been calibrated, the calibration screen would indicate a fixed dB level regardless of what was in the fixture prior to pressing OK. This did not affect calibration or use of the 250B after calibration, but has been corrected in this release. 250B Revision 12.33 08/11 1. Corrected several "default" INI file settings to reflect the way they were intended to be used. SetSysVariable. 250B Revision 12.32 07/11 1. Attempt to solve server exception during an etching run with raw output on. 250B Revision 12.31 07/11 1. Changed 50.0 Ohm Reflection fixture to 2220 50.0 Ohm Reflection. 250B Revision 12.30 07/11 1. First release for W-2220. 2. INI fixture definitions that are now Single-Port were called Reflection in previous revisions. 3. Added 50.0 Ohm Reflection fixture for W-2220. 4. Added an INI fixture entry "Use Power Calibration". If true, during network calibration, board-level power calibration is performed. If false, the board-level calibration from the factory is restored. 5. The "Maximum Power" entry no longer controls the use of or calibration of board-level power calibration. 250B Revision 12.28 06/11 1. The last revision could hang at startup in certain conditions when the number of test fixtures defined in the INI file was 20. This was most likely to happen with the etcher. 250B Revision 12.27 06/11 NOTE: Due to a calibration file error, revision 12.23, 12.24, 12.25, and 12.26 MUST upgrade. 1. Last revision did not write the fixture name to the cal file. After calibrating with that revision, no measurements worked. 250B Revision 12.26 06/11 1. Changed phase delta frequency for 2200 LC 1000K Ohm fixture from 500 KHz to 800 KHz to correct a problem with Port A calibration. 2. Changed the expected open amplitude for the 5910 5mW 12.5 Ohm PI from -88 to -78 because one port on some PCBs requires it. 3. On etching systems, added timeout for each etching cycle in the etching parameters. 4. Changed the phase delta frequency for 5910 1000K Ohm, 5910 1000K Ohm II, and 5910 1000K Ohm 32POS fixtures. 5. Added 5910 1000K Ohm (#1333) and 5910 High Drive 1000K Ohm (#1333) fixture definitions. 6. Allow 20 fixture entries now. 250B Revision 12.25 05/11 1. Fixed an etcher bug that would not measure C0 in all cases if no boat was in Line 1 on a dual etcher. 250B Revision 12.24 05/11 1. Corrected Phase Difference calculation during calibration. This corrected a C0 measurement problem seen on 1000K Ohm W-2200 test heads on Row A. Could affect others. 2. Added SweepRaw OLE routine. 3. Added MeasureX OLE routine. 250B Revision 12.23 05/11 1. Corrected a minor power calibration problem since revision 12.20. 2. Now disable all fields on the screen if "Allow Edit" is not checked. 3. 250B output is now off when not sweeping or measuring. 250B Revision 12.22 04/11 1. Revisions since 12.10 would not load in Windows 98. This has been corrected. 2. Added 2 new fixture types for multiport system. 250B Revision 12.21 04/11 1. Support narrow mode in dual etchers using only line 2. 250B Revision 12.20 04/11 1. Added support for multiple 250Bs via OLE (software key required). 2. Added support for multiple IR stations with multiple 250Bs (software key required). 3. Added support for a separate IR station (ahead of the crystal measurement station) via an INI variable. 4. Corrected problems with the OLE routines GetResultsX and GetBinNumberX. 5. Support narrow range calibration (via INI file settings). 250B Revision 12.11 04/11 1. Fixed a problem with high drive port selection on carousel platers when using the MFC-100 as a TTL I/O card. 250B Revision 12.10 04/11 1. Added W-2220 support. 2. An invalid error message that said "Unable to get driver handle" was prevented. 3. Adjusting serial number was not working for ports assigned to a 250B other than the first. Corrected that. 4. Improved narrow mode measurement for etching systems for some crystals. 250B Revision 12.02 02/11 1. No user significant change. 250B Revision 12.01 02/11 1. Improved Fr measurement when using Narrow sweep. 250B Revision 12.00 02/11 1. Added a Wide (Nonlinear Crystal) sweep type to be able to measure crystals when X1 is not linear near the resonance, such as when applying high power levels. 2. Added Enhanced Plus calibration to utilize a resistor (default 10.0 Ohms) to more precisely measure DLD resistances. 3. Added DLD2RAW test type. 4. Added the ability to set port frequency offsets. An INI variable enables this feature.2. Added display and manual control of 250B attenuator and multiplier on manual measurement screen. 5. Improved DLD measurements in some cases. 6. Improved enhanced calibration in some cases. 250B Revision 11.84 01/11 1. Fixed a problem with calibration that could cause erroneous measurements (possible problem since revision 11.70). 250B Revision 11.83 01/11 1. Fixed SweepGB OLE call. 2. Improved power calibration for 150K Ohm fixtures. Now they will pass verify calibration again. 250B Revision 11.82 12/10 1. Added Cp and Lp to network analyzer options. 2. Improved the network analyzer sweep measurement in some cases. 3. Fixed a problem with cursor selection and update in the network analyzer. This fixed the ability to set the cursors to min, max, zero points. 4. Allowed the network analyzer to graph backwards. 5. Improved narrow sweep measurements on the etching systems. 250B Revision 11.81 12/10 1. Improved network calibration for the 1000K Ohm 32-position etching system measurement PCB. 250B Revision 11.80 12/10 1. Added "5910 1000K Ohm 32POS" and "5910 High Drive 1000K Ohm 32POS" fixtures to fixture list. 2. Added a new sweep type "Narrow (Single Port)". It is the same as narrow mode except when measured from an etcher. 3. Fixed a bug in C0 measurement when the narrow mode sweep type is used in the etching system. 250B Revision 11.77 12/10 1. Improved the C0 measurement for the 1000K Ohm 32-position etching system measurement PCB. 250B Revision 11.76 12/10 1. Improved the C0 measurement for the 1000K Ohm 32-position etching system measurement PCB. 250B Revision 11.75 11/10 1. Improved power calibration for some lower frequency fixtures. 2. Added "5910 1000K Ohm 32POS" and "5910 High Drive 1000K Ohm 32POS" fixture definitions to INI file. 3. Changed all 5910 1000K Ohm fixtures to use 7.0 dBm for calibration level instead of 15.0 dBm. 250B Revision 11.74 11/10 1. No user significant change. 250B Revision 11.73 11/10 1. Fixed a bug for the etcher when using narrow mode. 250B Revision 11.72 10/10 1. Fixed a display problem with high drive soak in the plating parameters screen. 250B Revision 11.71 10/10 1. Change FRM and FRR so they don't return Dead if unable to oscillate at specified frequency. This allows binning to occur properly because any "Dead" is binned to 0. 250B Revision 11.70 09/10 1. Improved measurements on the 250D. 2. Changed "DLD Calibration" to "Enhanced Calibration". Allow use of Enhanced Calibration without DLD to improve calibration at specified power level. 3. Added open calibration to Enhanced Calibration. 4. Added a field to the manual measure screen to show power output to fixture based on fixture gain. 5. For 250D, added a check in network calibration if calibration will use the synthesizer, to check for proper synthesizer connections. 6. When using enhanced calibration, it now shows on the main screen. 7. Added frequencies to entries on manual measurement screen. 8. Improved calibration. 9. Changed Verify Calibration to show information based on frequency bands. 250B Revision 11.62 09/10 1. Added OLE commands to change FL measurement modes. 250B Revision 11.61 08/10 1. No user significant changes. 250B Revision 11.60 08/10 1. Previous version tried to initialize a 500A in manual measurement on Initialize Board button even when not a 250D. 2. Changed the expected open value during calibration for the 5910 56 Ohm fixtures. 3. Added an INI variable "High Drive Amp Present". When this is yes, the output level check on fixtures that require it will not be performed because it is not possible to detect the output level when the high drive amp is in-line. 250B Revision 11.58 08/10 1. Speed up spurious sweep on 250D. 250B Revision 11.57 07/10 1. Corrected bug in revision 11.53 that caused some DLD and spur tests to take longer. 250B Revision 11.56 07/10 1. Some QCC files could cause a measurement with DLD to take longer than they should. Corrected that. 2. Improved calibration for 250C and 250D systems. 250B Revision 11.55 07/10 1. Added an INI file variable Maximum Fast Sweep Step Size to allow a larger step size when the fast sweep type is used. 250B Revision 11.54 06/10 1. Corrected measurement issues on the etcher (5910i and Dual 5910i). 2. Made some measurement speed improvements for the etcher applications. 3. Added Etch To Target Fast Mode option on etcher. 250B Revision 11.53 06/10 1. Fixed a problem with calibration verification from revision 11.40. 2. Corrected an error message with the W-5910 system concerning power calibration frequency. 3. Corrected the power measurement for W-5910 systems in some cases. 4. Corrected DLD, spur, and overtone measurements on a W-5910 system. 5. Improved "fast" sweep mode for some parts. 6. Improved measurement speed on 250D when below 450 MHz to match 250C. Fix in rev 11.40 did not work. 250B Revision 11.52 06/10 1. No user significant changes. 250B Revision 11.51 06/10 1. Once DLD sweep changes were entered, pressing CANCEL on the way out of the test type dialog would not restore them to the original values. Corrected this. 2. When changing DLD sweeps, now warn and clear data before changing DLD sweep. 250B Revision 11.50 06/10 1. Allow carousel platers to high drive before first cycle without a heater soak. 250B Revision 11.40 05/10 1. Added DLD (single-point power) calibration. 2. Improved measurement speed on 250D when below 450 MHz to match 250C. 3. Improved network calibration (especially for the 250D). 4. Changed the upper limit on the calibration verification sweep (new INI variable) to 800 MHz for the 250D. 5. Improved power output setting. 250B Revision 11.30 05/10 1. Support the Dual W-5910i. 250B Revision 11.27 05/10 1. No user significant changes. 250B Revision 11.26 04/10 1. Allow shorter high drive soak when high driving during heater soak for W-5250S plating systems. 250B Revision 11.25 03/10 1. Support 5910i for watch crystals. 250B Revision 11.24 03/10 1. If DLD or SPUR graph are selected and continuous measurements are running with a Dead part or no part in the socket, the 250B will no longer hang up after several seconds. 250B Revision 11.23 02/10 ALL OLDER 250Bs with revisions greater than 11.10 should upgrade to this revision. 1. Fixed a bug since 11.11 for older 250Bs (not 250B-1s). This bug affected frequencies above 155 MHz. 250B Revision 11.22 01/10 1. Provided better handling when switching from an external standard to an internal standard so that a failing external standard would not corrupt the internal standard calibration. 250B Revision 11.21 01/10 1. Improved the routine to select the folder to save a calibration set. 250B Revision 11.20 01/10 1. Can now change the scales on calibration sweep in the network analyzer. 2. Created or modified several different variables in the INI file for the 250D. 3. Added fixture types for the 5710A to the INI file. 250B Revision 11.11 12/09 1. Added an OLE routine (SweepGB) to perform a network sweep and return G and B. 2. Made the calibration sweep in the network analyzer exactly match the calibration routine as far as averages used for each band. 3. The INI file variables will now remain in a specific order to help keep the file easier to read. 4. Removed INI file variables that references band 3 on a 250B (250B only has 2 bands). 250B Revision 11.10 12/09 1. Additional 250D support. 2. Changed save and use calibration set to use directory tree. 3. Changed system error messages to be more clear. 4. Added 5 mW fixtures for 56 Ohm measurement PCB. 250B Revision 11.00 12/09 1. Initial 250D support. 250B Revision 10.91 12/09 1. Added 5910 56 Ohm PI and 5910 High Drive 56 Ohm PI fixtures to the INI file. 2. Added support for the W-5710A. 250B Revision 10.90 11/09 1. Added 2200 50.0 Ohm LC Leaded fixture type. 2. Add a new "Fast" sweep. 250B Revision 10.89 11/09 1. Fixed code handling the carousel plating dialog box. 250B Revision 10.88 10/09 1. Added 5710A support. 2. Improved interface with W-5600. 3. Increased the maximum number of graph points in Network Analyzer to 3,000 from 2,000. 250B Revision 10.87 10/09 1. Made Benchtop with IR system measure IR while measuring setup file parameters to reduce measurement time. 250B Revision 10.86 10/09 1. No user significant changes. 250B Revision 10.85 09/09 1. No user significant changes. 250B Revision 10.84 09/09 1. Fixed a problem where some 250B cards coupled with certain crystals would report the wrong amplitude value for RF In at low amplitude levels (below -100 dBm). 2. Added 350D 50 Ohm PI Fixture. 3. Added 4310 Dual 1000K Ohm Fixture. 250B Revision 10.83 09/09 1. Improved Measured FL for some parts. 250B Revision 10.82 08/09 1. Corrected problems with the 5250S plating parameters and high drive. 250B Revision 10.81 07/09 1. Corrected a port switching problem for the W-2200i. 250B Revision 10.80 07/09 1. Adding DLD tests, DLDD, DLDDS, and DLDDR to determine the maximum difference in resistance between steps. 250B Revision 10.70 06/09 1. Fixed Network analyzer not displaying some menu items (since revision 10.61). 250B Revision 10.62 06/09 1. Allow operator to high drive on any cycle in a 5250 plater. 2. Allow operator to specify when to wait for completion of temperature soak in a 5250 plater 250B Revision 10.61 05/09 1. No user significant changes. 250B Revision 10.60 05/09 1. Added support for 32 position multiport system. 250B Revision 10.50 05/09 1. There is now a configurable delay between each plating cycle in a 5250 plater. 2. Solved a bug with an 8-port system using two 2451 switch controllers where port B selections were not always working. 250B Revision 10.40 03/09 1. Added support for 1 GHz frequency extension card. 2. Added 1 GHz 12.5 Ohm PI fixture to INI. 250B Revision 10.30 03/09 1. Added 5511 12.5 Ohm PI fixture. 2. Added 5511 High Drive fixture. 3. Support W-2200i. 4. Corrected incompatibility problems with Office 2007. 250B Revision 10.22 12/08 1. The settings for the 2200 30mW PI Barrel were corrected in the INI file. 2. The Benchtop IR system now has a number of bins setting in the INI file. 3. Added 2200 1000K 4 Leaded test fixture. 250B Revision 10.21 11/08 1. Added 2200 30mW PI Barrel test fixture. 250B Revision 10.20 11/08 1. Added Benchtop with IR system. 250B Revision 10.11 11/08 1. Added support for motorized shutter versions of the etchers. 250B Revision 10.10 10/08 1. Support the W-2200i. 2. Added selection to "Allow Save Initial Measurements" for the W-5910. 250B Revision 10.08 09/08 1. Corrected a change made in revision 10.02 that prevented changing the power calibration frequency. 250B Revision 10.07 08/08 1. No user significant changes. 250B Revision 10.06 08/08 1. High drive test type now includes the frequency delay while measuring if HighQ or Narrow mode are specified. 2. High drive test type improved to track frequency better on high Q parts. 3. Fixed main display to show high drive power levels when high drive port is selected (display error since revision 9.70). 250B Revision 10.05 08/08 1. Restore port B for sorting machines. 250B Revision 10.04 07/08 1. Fixed a problem with software key recognition from previous revision. 2. The high drive port on channel B in the 12SA, 12SA-Controller, 5510, 5710, and 24SA systems was was selecting port A instead since revision 9.60. 250B Revision 10.03 07/08 1. The OLE routine SelectPort has been corrected. It has been a problem since revision 9.60. 250B Revision 10.02 07/08 gpc 1. Removed an invalid warning about power calibration frequency that started appearing in revision 10.00. 250B Revision 10.01 07/08 1. Fixed bugs in new OLE DLD routines. 250B Revision 10.00 07/08 1. Allows power calibration to be performed at a customer specified frequency instead of the standard 10 MHz if a variable is set in the INI file. This can improve DLD measurement accuracy. 2. Display the power calibration frequency on the calibration dialog box. 3. Added OLE calls to access DLD data: GetNumberOfDLDPoints, GetDLDDataPoint, and GetAllDLDData. 250B Revision 9.91 05/08 1. No user significant changes. 250B Revision 9.90 04/08 1. Added port CL offset for FL measurement to the INI file. 250B Revision 9.81 04/08 1. Fixed a software bomb if displaying a DLD or Spur graph and a part was dead (problem since revision 9.72). 250B Revision 9.80 04/08 1. Corrected an issue with the OLE call to SetPort. 250B Revision 9.79 04/08 1. Now both a sound card and the speaker work for the beep modes. 250B Revision 9.78 04/08 1. Fixed a bug in MeasureFl for physical load or calculated load from revision 9.70. 250B Revision 9.77 03/08 1. No user significant changes. 250B Revision 9.76 03/08 1. No user significant changes. 250B Revision 9.75 03/08 1. No user significant changes. 250B Revision 9.74 03/08 1. Support 5910i in demo mode. 250B Revision 9.73 02/08 1. Increased the number of samples per calibration for bands 2 and 3 on the 250B and band 2 on the 250C (INI file change). 2. Increased the calibration verification factors for bands 2 and 3 on the 250B and band 2 on the 250C (INI file change). 3. Changed "High Drive 5910 5mW 12.5 Ohm PI" "Output Check Frequency" to None (INI file change). 4. Additional DLD entries were being initialized to valid settings. This could cause a database update to add more DLD steps if all entries were full. Changed this to initialize to NO_VALUE. 250B Revision 9.72 02/08 1. No user significant changes. 250B Revision 9.71 02/08 1. No user significant changes. 250B Revision 9.70 01/08 1. Initial support for W-5910i. 250B Revision 9.63 12/07 1. Added support for 5910i Lite. 250B Revision 9.62 12/07 1. Added new 5910 1000K Ohm II fixture. 2. Added new 4310 1000K Ohm fixture. 250B Revision 9.61 11/07 1. Changed the Expected Open Amplitude for calibration from -91.0 to -82.0 in 5910 High Drive Fixture. 2. Corrected expected Short, Load, and Open amplitudes for calibration in 5710 Fixtures. 250B Revision 9.60 09/07 1. Recently, the number of fixtures that could be displayed in the menu was increased, but they were not accessible. This has been corrected so that 15 fixtures are selectable in the menu. 2. If there were more than 500 measurements in the QCC file, the 250B could open slowly. This has been made much faster. 3. Added the ability to set power into RR. Power will be applied at the wattage specified once the actual resistance of the crystal has been determined. 250B Revision 9.51 08/07 1. Since revision 9.41, High Q Sweep type would not be saved properly to database. Update to this revision for all users of 9.40, 9.41, or 9.50. 2. Added Blank Sorting and Base Plating to system types available. Default bins and fixture types appropriately. 250B Revision 9.50 07/07 1. Added new test types for 2200: AR/T, MR/T, R/AT, and R/MT. 2. Recommend upgrading from 9.40 to this revision to correct a graph horizontal axis problem. 250B Revision 9.41 07/07 1. Added 1000K Ohm Benchtop Top fixture. 250B Revision 9.40 06/07 1. Reduced initial DLD sweep power level to reduce the impact of the initial frequency measurement on the DLD sweep measurements. Recommand all DLD users to update to this revision. 2. Changed DLD sweep resistance to allow "Use Reference". 3. DLD fields can no longer be modified if "Allow Editing" is turned off. 4. Using the "Clear all measurements" from the menu/toolbar now compacts the database. 5. Increased maximum number of DLD sweep entries from to 35. This allows up to 70 individual values. 6. Clearing all graphs on a "Dead" part. 7. Corrected a bug in the statistical mode "Measurements In Range" so that it is now functional. 250B Revision 9.33 04/07 1. This revision corrected a problem that could occur When using long test type labels. It was possible for a failure to cause the 250B to generate an exception and shut down. 250B Revision 9.32 04/07 1. Added 30mW 12.5 Ohm PI fixture. 2. Added 175mW 12.5 Ohm PI fixture. 3. Added 5910 5mW 12.5 Ohm PI fixture. 4. Added High Drive 5910 5mW 12.5 Ohm PI fixture. 250B Revision 9.31 03/07 1. Fixed a problem that could cause the 250B to shutdown while measuring. 250B Revision 9.30 03/07 1. Added the ability to set a Duty Cycle for the High Drive test type. 2. If using NSPF1, NSPFR, NSPRR, or NSPUR tests you should upgrade to the revision. 250B Revision 9.25 03/07 1. Added support for W-940A. 2. Fixed horizontal scrolling of values shown in statistics area of main display. 3. Added 2200 LC 4 SMD REV 3 fixture definition. 250B Revision 9.24 02/07 1. No user significant changes. 250B Revision 9.23 02/07 1. No user significant changes. 250B Revision 9.22 02/07 1. Increased the maximum number of fixtures in the menu from 10 to 15. 2. Added three 5mW fixture definitions and a 12SA SMD fixture definition. 3. Added Edit/Undo to main screen. 250B Revision 9.21 01/07 1. Corrected a problem where it was possible for FDLDH to report DLD dead when that was not the case. 250B Revision 9.20 01/07 1. Added support for W-5600. 2. Added custom (ttCUSTOM) test type. 3. Fixed a problem with initial and final high drive soak on the etching parameters screen. 250B Revision 9.11 12/06 1. Added 2200 LC 1000K Ohm test fixture. 250B Revision 9.10 12/06 1. Added a fixture type variable to the INI file to support reflection fixtures. 2. Added a delta phase measurement frequency to the INI file to support certain fixtures. 3. Allow high drive soak time to be entered in 1/10s of seconds for platers and etchers. 4. Added buttons to cursor boxes on network analyzer to easily set sweep start, center, or stop. 5. Added test types NSPF1, NSPFR, NSPRR, and NSPUR. Added dHz and dKHz units to SPFR. 250B Revision 9.07 11/06 1. Added several new fixture definitions to the INI file. 250B Revision 9.06 11/06 1. No user significant changes. 250B Revision 9.05 11/06 1. Add older large style 5250 plater support. 250B Revision 9.04 10/06 1. The statistical data was not valid when the 250B was run as a server from the 250BCD program. 2. It is more obvious now that the top line of measurements is being continually updated in "Continuous" measure mode. 250B Revision 9.03 09/06 1. Fixed a problem where test types like STATUS, BIN, DATE, and TIME could have a binning option set. 250B Revision 9.02 08/06 1. Calibration sweep in network analyzer would sometimes not show the correct number of points. 250B Revision 9.01 08/06 1. Made sure phase is displayed between +/- 180 degrees on Network Analyzer. 250B Revision 9.00 08/06 1. Added an option to display milliseconds in the TIME test type by selecting a different unit. 250B Revision 8.94 07/06 1. No user significant changes. 250B Revision 8.93 07/06 1. SSZ and SSMINZ are no longer C0 compensated. This makes sense for their use. 250B Revision 8.92 06/06 1. No user significant changes. 250B Revision 8.91 06/06 1. Made SSDLDF an absolute value. 250B Revision 8.90 05/06 1. Added a DF test type (1/Q). 2. Added SSZ, SSMINZ, SSMINF, and SSDLDF test types. 250B Revision 8.81 04/06 1. Modified the way autoscaling works in the Network Analyzer. 250B Revision 8.80 04/06 1. Added "Etch by Time with Adaptive Method" etching method. 250B Revision 8.72 03/06 1. No user significant change. 250B Revision 8.71 03/06 1. Added proper test fixtures for the 350B-2 in the INI file. 2. Properly display the degrees symbol in Simplified Chinese Windows systems. 250B Revision 8.70 03/06 1. Added 5910 High Drive 1000K ohm fixture to INI file. 250B Revision 8.60 03/06 1. Added C0 compensated network analyzer sweep option. 250B Revision 8.51 03/06 1. No user significant change. 250B Revision 8.50 02/06 1. Added 5910 1000K ohm fixture. 2. Added Narrow sweep mode for crystals that are known to be near the reference frequency or for crystals similar to watch crystals that closly follow the 4 term model (no spurious). 3. Added high drive after final measurement option to etching parameters. 4. Added Etch all Cycles to Target then Increment mode to 5910 parameters. 5. Added Etch all Cycles by Time Target then Increment mode to 5910 parameters. 250B Revision 8.44 01/06 1. Added 2mW test fixture. 250B Revision 8.43 01/06 1. Fixed a problem that limited the maximum output power on 150K Ohm test fixtures. 250B Revision 8.42 01/06 1. Improved the calibration verification routine for 150K Ohm fixtures. 250B Revision 8.41 12/05 1. Changed Cy and C0 measurement offsets for the new 4310 fixture. 250B Revision 8.40 12/05 1. Added fixtures to the INI file for the new 4310 chamber. 250B Revision 8.37 11/05 1. Made more improvements to the axis labels on some graphs (made them more readable). 250B Revision 8.36 11/05 1. Improved the axis labels on some graphs. 250B Revision 8.35 11/05 1. A bug in the new output check feature was corrected. 250B Revision 8.34 11/05 1. Improved the handling of the new statistics data in the database. 250B Revision 8.33 10/05 1. Improved the Output Level check feature. 250B Revision 8.32 10/05 1. No user significant change. 250B Revision 8.31 10/05 1. All file save and open dialog boxes will now remember the settings used for displaying the files. 250B Revision 8.30 10/05 1. Added INI file entries to allow for output level checking of test fixtures. This is done automatically at the end of calibration to verify that fixtures are cabled properly. This is primarily used for high drive fixtures. 250B Revision 8.22 10/05 1. Statistics data was not being updated on the screen as measurements were made (since revision 8.20). This problem was corrected. 250B Revision 8.21 10/05 1. No user significant change. 250B Revision 8.20 10/05 1. Fixed a problem that caused DLD5 to display 1J#5. 2. LFR and LRR are now included in the new DLD analysis range. 3. Added test types RefCL and RefFR for temperature systems and etching systems to display the reference CL and reference FL values on printouts. 4. Added high drive to benchtop systems (may require special test fixture). 5. Added test type DLD9 for MaxR/MinR. 6. Added test types PC1, PFL, PFR, PL, and PRR for etching and plating systems. These test display the values for C1, FL, FR, L, and RR measured prior to processing (etching or plating). 7. Added KOhms units to the test type Rpp. 8. Crystals that measured "Dead" are no longer included in statistics calculations. 9. Added two new statistics filters, "pass" and "six times limit window". 250B Revision 8.13 09/05 1. Now registering the 250B OLE server so that Visual Basic applications can access the 250B interface class. 250B Revision 8.12 08/05 1. No user significant change. 250B Revision 8.11 08/05 1. No user significant change. 250B Revision 8.10 08/05 1. Added the 350D High Drive test head to the INI file. 250B Revision 8.04 07/05 1. No signficant change. 250B Revision 8.03 07/05 1. Made test type HDRV available for all systems except benchtop. 250B Revision 8.02 07/05 1. Nothing user significant. 250B Revision 8.01 07/05 1. Corrected a problem with the DLD analysis range. 250B Revision 8.00 07/05 1. Added support for up to 16 ports with cascaded 2451s attached to port A. 2. Adding an analysis range to DLD test types allowing individual DLD tests to analyze only a portion of the DLD sweep. 3. Added test type DLD8 for MinR/RR. 4. Added test type HDRV to high drive the crystal for the sorting system (may require special test fixture). 250B Revision 7.94 07/05 1. Now restricting calls to open a new setup file so that only existing files can be chosen. Previous revisions allowed the operator to enter a filename that did not exist. 250B Revision 7.93 07/05 1. No user significant change. 250B Revision 7.92 07/05 1. No user significant change. 250B Revision 7.91 07/05 1. Fixed a problem in revision 7.90 that prevented a 250B-1 from being calibrated. 250B Revision 7.90 07/05 1. Calibration averages are now unique between 250B and 250C and are frequency band specific. 2. Calibration verification error is now unique between 250B and 250C and is frequency band specific. 250B Revision 7.80 06/05 1. Added Calibration as a sweep type option in the Network Analyzer so that a sweep can be performed that duplicates the calibration sweep. 250B Revision 7.74 06/05 1. No user significant change. 250B Revision 7.73 06/05 1. No user significant change. 250B Revision 7.72 05/05 1. Enhanced data written to the raw output file to aid in troubleshooting. 250B Revision 7.71 05/05 1. No user significant change. 250B Revision 7.70 05/05 1. Created a printing folder, PrintQ1 and PrintQ2. Reports were changed so that the fixed path is no longer included. 2. Addressed a problem with Crystal Reports handling of Access databases. Prior releases may have only printed data from the first part in some cases. 250B Revision 7.61 04/05 1. Changed the phase display on the Network Analyzer so it is always in a -180 to +180 degree range. 250B Revision 7.60 04/05 1. The test type FCF/T now allows a temperature range specification. 250B Revision 7.50 04/05 1. Allow values from cursor boxes on Network Analyzer display to be copied. 2. Added the test type DLDH2R for resistance at DLDH2. 3. Added print on pass and print on fail. 4. Added scale up and down features on network analyzer. 5. The data graph on the network analyzer is saved on exit and restored when restarted. 6. Switching network calibration on and off in the Network Analyzer no longer requires a new sweep. 7. Changing the horizontal scale in the Network Analyzer now effectively zooms in/out and does not require a resweep. 8. Created auto/up/down scaling for horizontal scale in the Network Analyzer. 9. Added a calibration verification feature. 10. Added option to display DLD graph in ppm instead of Hz. 11. Added test type FCF/T on temperature systems for frequency of curve fit over temperature. 12. Added test type SN on temperature systems for serial number to enable display on some printouts. 250B Revision 7.42 03/05 1. Made IR failures go to bin even if the part is measured "Dead". 250B Revision 7.41 01/05 1. No user significant change. 250B Revision 7.40 01/05 1. Fixed an error in calculation of test types displaying values in PPM referenced to Measure FR and Measured FR*3. 2. PPM measurements can now be referenced to Measured FL and Measured FL*3. 3. Added test type Rpp for pin to pin resistance measurement.