2500 Revision 5.01 11/23 1. Corrected a problem with sizing the edit boxes. 2500 Revision 5.00 05/23 1. Solves a problem where an invalid database path name could cause the 225A to close when trying to open a new QCZ file. 2500 Revision 3.30 05/23 1. Support new SA Driver. 2. Corrected a problem with the database update from revision 3.20. 2500 Revision 3.20 03/23 1. Prevent the program from closing if a direct Excel Export is chosen whe Excel is not installed on the PC. 2. Diode systems with part orientation set to automatic will now only determine orientation once per part during the run. 3. Corrected issues with the run/stop button becoming a blue box during a run. 4. Prevent a program crash when showing the data graph. 5. Diode systems include new 225 with improved auto orientation settings window and improved checkout. 2500 Revision 3.12 04/22 Release B: Added test types RAWZ, RAWZ@V, RAWPHASE, and RAWPHASE@V for 4284A and 4980A LCR Meters. Changed the way the checkout screen works in diode systems to make it clearer. 1. Corrected wheel definition for T-1457 wheel. 2500 Revision 3.11 04/22 Release B: Supports Windows 10 for transistor systems. Corrects the About box in the 225A for transistor systems. 1. Added wheel definition for T-1456 and T-1457 wheels to transistor INI file. 2500 Revision 3.10 12/21 NOTE: Any system that is not an IR system that is running any revision since 2.80 should be updated. Release B: Corrects a problem for capacitor systems since Revision 2.60 that prevented ALC from functioning correctly on the 4284A and 4980A bridges. 1. Fixed a bug since revision 2.80 that occurred when a run ended or was stopped. At that point, the subsystem type would be overwritten to IR. This changes, among other things, how positions on the wheel are determined. 2500 Revision 3.00 11/21 1. When selecting the report "Excel Export Original Format" can now change the output folder. 2500 Revision 2.96 04/21 1. Corrects a problem with serial numbers in some systems. 2500 Revision 2.95 04/21 1. No user significant changes. 2500 Revision 2.94 12/20 1. Corrected a problem with communications. 2500 Revision 2.93 09/20 Release B: Corrects an issue with the checkout screen on IR systems. 1. Solves a problem since revision 2.50 that prevented the MUX controller from working. Also adds the ability to use the front panel on Source Meters in the diode system. 2500 Revision 2.92 09/20 1. Eliminated some GPIB errors when exiting a diode system caused by communications with the source meters. 2500 Revision 2.91 12/19 Release C: Adds instrument driver support for Keithley Source Meter models 2461 and 2470. Release B: Corrects an issue losing desktop ICONs when upgrading a combo system. 1. Support new combo software keys that are licensed for both XP and Windows 10. 2. Modify the HP voltage test during the open calibration so that it uses the "Minimum Open HP" variable from the INI file instead of a fixed 80% ratio. This also reduced the voltage level required to pass the test. 2500 Revision 2.90 11/19 1. Made it easier to stop a run during a bias voltage soak, bias voltage discharge, or measurement. 2. Added the VAC@V test type. 3. In test types that are done at a bias voltage, the soak is always performed based on the settings in the test type. Previously, if the bias voltage had not changed and the soak time had not changed, the soak would not occur. 2500 Revision 2.82 11/19 1. Revisions 2.80 and 2.81 did not include the new 225A capacitor test types MQCV, MQCC, VAC, and VDC. 2500 Revision 2.81 11/19 1. The Start/Stop run button and chamber ICON were not being updated in the previous revision. 2500 Revision 2.80 10/19 1. On capacitor and IR systems, the bias box capacitors will be discharged at the end of any run, including one that is ended by the operator. 2. On capacitor systems with certain equipment, an automatic soak and automatic discharge feature have been added. Hardware monitoring is used to insure proper soak and discharge times. 3. On capacitor systems with certain equipment, the measurement status can now be monitored using MQCV and MQCC test types. This allows the test to determine if the ALC circuit was unable to achieve the desired output conditions. 4. On capacitor systems with certain equipment, test types were created to detect the applied oscillator output voltage level and bias output voltage level. This allows the detection of situations in which the LCR meter is not properly connected to the DUT. 2500 Revision 2.70 10/19 1. Added a dropdown to select the units for the capacitance load value used when calibrating. Previously, the units were based on the last value entered and, when changing the value, the operator had to convert units. 2. Improvements were made to the way the database was handled when being updated. 2500 Revision 2.61 08/19 1. Corrected a problem that could cause an exception when attempting to print or preview. 2. Added "Selecting OK will update the run file using the Setup Files indicated..." when selecting OK to configuration edit. 2500 Revision 2.60 05/19 1. Improved interface with instruments to eliminate timeouts. 2. Improved handling of INI and SET file to prevent corruption. 3. Corrected access to the manuals in the Help menu. 4. Added a user prompt when automatic calibration is selected and it fails instead of just terminating the run. 5. Added popups in some cases during soak and long measurements. 2500 Revision 2.55 06/18 1. Added IR@V test type in Capacitor system. 2500 Revision 2.54 06/18 1. No user significant changes. 2500 Revision 2.53 05/18 1. No user significant changes. 2500 Revision 2.52 05/18 1. No user significant changes. 2500 Revision 2.51 05/18 1. No user significant changes. 2500 Revision 2.50 10/17 1. Support for Windows 10. 2. Support for USB GPIB adapter. 2500 Revision 2.41 02/17 Release D: Allows another decimal place of entry for soak times. Release C: Supports PCIe TTL I/O card. Allows older parallel port software keys to be used. Release B: Use Release C instead. 1. Fixed a bug created in the last revision that caused the setup file measurements to only use the first test type defined. 2. Added software revision and subsystem type to raw output. Releasing 2500 Revision 2.40 01/17 NOTE: Due to a bug introduced in this revision, it should be replaced with 2.41. 1. Support override on power supply selection for diode systems. 2500 Revision 2.34 06/13-08/24 Release F: Corrected a problem with software key recognition. Release E: On transistor systems, the system is now more tolerant of noisy EOT signals. Release D: Now shows interrupt rate in About box on systems with a TTL I/O card. Release C: Capacitor systems were soaking for each test type. Code now only soaks once for all test types unless there is a difference in bias voltage or soak time for one of the test types. Release B: On capacitor and IR systems, the discharge time required when using the Keithley 487 picoammeter as the power supply is greatly reduced. 1. Since revision 2.23, capacitor systems were not measuring component data when selected and were measuring it when not selected. 2500 Revision 2.33 05/12 1. Prevent application from crashing and display message if usable wheel positions is less than 1. 2500 Revision 2.32 04/12 1. Added menu entry to access 4220 chamber manual. 2. Added T-1378 wheel to transistor system. 2500 Revision 2.31 03/12 1) Since revision 2.91, Transistor, Resistor, Diode, and Inductor systems would report that the setup file could not be found when selecting OK after editing the configuration. 2500 Revision 2.30 02/12 Release B: For diode systems: Updates the maximum current and voltage settings on the 2410C and 2430C. Also, the 2410C has two ranges with different voltage and current maximums. This revision is aware of this limitation and now picks the correct supply for configurations that were not legal before. One example is VR with a target of 50 V at up to 30 mA. Previous revisions would pick the 2410C, but it cannot output that current above 21 V. The new revision correctly picks the 2430C for this setting. 1) Added support for override to capacitor bias voltage soak in edit configuration dialog. 2500 Revision 2.23 02/12 1. Resistor, transistor, and diode systems would not show the beginning serial number when editing a previous configuration line. Corrected this. 2. Systems with subparts (like resistors or diodes) would not display the serial number on printouts or exports. This has been corrected. 3. This is the first revision to support the nominal bias voltage soak for capacitor systems. It was added in the last release, but was not implemented. 2500 Revision 2.22 12/11 Release C: Added bias voltage soak time to capacitor systems for nominal bias voltage application. Release B: All Capacitor Systems should upgrade. Allows bias voltage entry to be negative. Also fixes a problem with bias voltage level of 0.0 V. Previous releases would leave the power supply setting unchanged if 0 V bias was specified for any capacitance measurements. 1. In the capacitor system, when calibrating, the routines were not handling the wheel motion properly and were not always delaying for the contact delay specified in the INI file. Corrected this. 2. Added T-814 wheel to transistor system. 2500 Revision 2.21 12/11 1. In the capacitor system, the load value for capacitance and dissipation factor was not displaying correctly in the options dialog. 2500 Revision 2.20 08/11 Release C: On Capacitor Systems, will not discharge capacitors between each bias voltage setting to speed up the measurements. Release B: Show up to 3 decimal places for Oscillator Level in test type setup. Corrected Excel Export for Setup File Parameters. 1. Added an INI file entry to the Wheel category to identify the name of the fixture to use in the W-225A. 2. Removed the WHEEL T-295 2W 4 Position, WHEEL T-295 2W 8 Position, WHEEL T-295 4W 4 Position, and WHEEL T-295 4W 8 Position (for resistor systems). 3. Created a WHEEL T-295 36 Position 4 SubParts, WHEEL T-295 36 Position 8 SubParts, WHEEL T-295 72 Position 4 SubParts, and WHEEL T-295 72 Position 8 SubParts (for resistor systems). 4. With new wheel definitions in resistor system, 4-wire and 2-wire measurements can be made in the same run using WHEEL T-295 36 Position 4 or WHEEL T-295 36 Position 8 subparts. 5. Removed T-295 2W 4 Position, T-295 2W 8 Position, T-295 4W 4 Position, and T-295 4W 8 Position fixture types from the W-225A INI file. 6. Created a new T-295 fixture to replace all four original T-295 fixture definitions. 7. Fixed a bug in capacitor systems when calibrating a load capacitor. This was a problem only on capacitors less than about 10 pF. 8. Added and INI variable to set 2 wire and 4 wire port offsets for resistor systems. 2500 Revision 2.19 06/11 Release B: Resistance Systems: Keithley 6620 Current Source properly initialized and shutdown when configured for system but not used. Solved problem with 2-wire and 4-wire resistance measurements when a Current Source was configured on the system. 1. Updated to set new resistor current source settings when making measurements. 2. Renamed Power Supply 1 mux card descriptor from LO Sense to - Source in 225 INI. 3. Renamed Power Supply 1 mux card descriptor from HI Sense to + Source in 225 INI. 2500 Revision 2.17 03/11 1. Added "Current Source" as a supported resistance measurement mode (resistance systems). 2. Added support for Keithley 6220 dD current source (resistance systems). 3. Added new measurement R@I which calculates resistance at an applied current (resistance systems). 4. Added power supply to resistor checkout (resistance systems). 2500 Revision 2.17 03/11 Release D: includes additional comments in the raw output file for debugging purposes Release C: includes additional switch delay for resistor systems using a mux box Release B: includes the ability to set contact check resistance range on diode systems in the INI file and adds code to disable contact check. 1. If the run file has been modified but not saved when RUN is selected, application now gives the opportunity to save the changes. 2. Changes to the W-225A software for IR systems now includes a test fixture resistance in the INI file to support the newer bias box 3 KOhm resistance and the older bias ring resistance of 562 KOhms for a better IR calculation. 3. In IR systems, current measurements that were less than 0.0 (less than the ability of the system to measure) were incorrectly set to 1.0e14. This has been corrected to 0.0. 4. For IR systems, added an initialize button to the checkout screen for the picoammeter. 5. For IR systems, the current reading on the checkout screen is now autoscaled so that small values (pA) can be viewed. 6. For IR systems, added a minimum valid IR current reading to the INI file. This is the minimum valid current for the system and sets the maximum IR value that can be calculated. For most systems, this is 1 pA. 2500 revision 2.16 01/11 1. Supports a new bias voltage protection for capacitor systems. 2. Added support for a Tesec transistor tester. 3. Fixed a communication error with the 6517A driver. 2500 Revision 2.15 10/10 1. In Excel export, show the error that occurred instead of "-----". This means contact failures and interlock failures are indicated with a text string now. 2500 Revision 2.14 01/09 Release B includes ramping voltages on capacitance bias supply to help with high voltage bias. 1. Add Workbook save when finished exporting older VB format on diode systems. 2. Changed code so that Excel will prompt to save when the operator exits the older VB format Excel export if they change anything. 3. Changed the format of the time for older VB Excel export. 4. Corrected month in older VB Excel export. 2500 Revision 2.13 11/08 1. For older VB format Excel export on diode systems, show spreadsheet as data is exported and leave spreadsheet open until operator closes it. 2500 Revision 2.12 10/08 1. For older VB format Excel export on diode systems, allowed existing files to be overwritten with new data so that existing print macros work. 2. For older VB format Excel export on diode systems, changed the sheet names from "Measurement1" to "Measurement 1". 2500 Revision 2.11 09/08 1. The diode report format that matches the older VB format was exporting too many columns of data. This has been corrected. 2500 Revision 2.10 08/08 1. Changed access to the diode report format that matches the older VB format. 2500 Revision 2.00 06/08 1. Added DUT test type. 2500 Revision 1.90 10/07 1. Added support for test wheels T-295 2W and T-295 4W in resistor system. 2. The Setup File Parameters report was not displaying all of the ID string for subparts. Increased the width of this field. 2500 Revision 1.89 09/07 1. Fixed a bug with the GeneralSettings database table CRC. 2500 Revision 1.88 08/07 1. Compact database before calling Crystal to be sure data is in correct order. 2. This release fixed a problem with the test types CTC and DLTC/C when no component data measurements were enabled. 3. Added Edit Undo command. 2500 Revision 1.87 07/07 1. Allow oscillator voltage levels above 1.0 VAC. 2. Fixed timing problems related to calibrating certain LCR meters. 2500 Revision 1.86 04/07 1. Changed maximum length of serial numbers to 30. 2500 Revision 1.85 02/07 1. New 225A revision fixed a problem with maximum current on the diode test system. 2. Previous release had bugs in initializing capacitor settings. All 1.84 should be upgraded. 2500 Revision 1.84 01/07 1. Fixed a problem with Crystal Reports crashing when printing some older runs. 2. Fixed a problem with ALC on 4284A and 4980A bridges. 2500 Revision 1.83 01/07 1. Added support for 25 position wheel. 2. Now able to measure Rs, Rp, and G on capacitor systems. 3. Corrected a problem where Q and D measurements were swapped on capacitor systems with the 4278A meter. 4. Added 4284A as a valid DMM instrument for resistor systems. 2500 Revision 1.82 09/06 1. This revision solves a problem that could cause the program to close without warning during a run. 2500 Revision 1.81 09/19/06 1. Added E4980A LCR meter support. 2. Fixed a problem with CTC and DLTC/C when component test types were used for the calculation. 3. Added software to prevent the "Right Truncated" error. 4. Certain capacitor runs will be faster now as the result of streamlining communication with the LCR meter. 2500 Revision 1.80 07/06 1. Added wheel definition for T-1154 (10 or 20 part) wheels to transistor INI file. 2. Changed First Skipped Position and Last Skipped Position in INI file to a list of skipped positions. 2500 Revision 1.72 05/06 1. Corrected a problem since revision 1.70 with the displayed value for SETT and TEMP test types. 2500 Revision 1.71 05/06 1. Allow no component measurements for capacitor systems. 2500 Revision 1.70 05/06 1. Added a Single Line Summary option for Setup File Parameters report. 2500 Revision 1.60 09/05 1. Added discharge time override for capacitor system. 2. Support two chambers. 3. CTC and DLTC/C calculations may now use any test type instead of just capacitance. 4. Added RawQ and RawD test types. 5. Added D to load calibration. 2500 Revision 1.50 07/05 1. Allow measurement of a test at a single temperature point. 2. Added test types GP@V, GS@V, RP@V, and RS@V. 2500 Revision 1.41 06/05 1. No user significant changes. 2500 Revision 1.40 05/05 1. Added Position Offset in Diode.INI. 2. Added DLTC/C test type. 3. Allowed TC test types to use a reference temperature other than the second temperature. 2500 Revision 1.30 04/05 1. Added DELTA, CLASS, SN, RTDT, and DRTDT test types. 2500 Revision 1.21 01/05 1. Add %/degree C for TC and % for DLT types. 2. New wheel support in INI. 2500 Revision 1.20 12/04 1. Support load calibration. 2500 Revision 1.11 11/04 djr 1. No user significant changes. 2500 Revision 1.10 11/04 1. Support capacitor testing. 2. Support resistor testing. 3. Added Repeat line in temperature table. 2500 Revision 1.01 10/04 1. New wheels in transistor INI file. 2500 Revision 1.00 07/04 1. Initial release.